Automated Test Base Cleaning Line for Type-Specific Routing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional test base cleaning in semiconductor manufacturing is labor-intensive and prone to manual misjudgment of cleaning processes due to varying test base forms, leading to inefficiencies and potential damage to components.
Innovation Solution
A fully automated test base cleaning line utilizing a scanning device to identify test base types and a robotic arm to move test bases through multiple cleaning mechanisms, including image capturing and laser devices, for precise cleaning operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If manual cleaning operation is used, then flexibility in handling different test base types is maintained, but labor cost and time consumption increase significantly
Solution Approach 1:
The system enables automated self-service cleaning by using the barcode information on the test base itself to automatically determine and execute the appropriate cleaning process, eliminating manual intervention while maintaining adaptability to different test base types
Solution Approach 2:
The system changes operational parameters automatically based on the test base type identified through barcode scanning, adjusting cleaning parameters such as laser power, cleaning mechanism selection, and process sequence according to the specific test base requirements
2Ease of operation
If manual judgement of test base type is used, then simple equipment operation is maintained, but misjudgment and wrong cleaning process occur due to human error
Solution Approach 1:
The system replaces the manual mechanical judgment process with an automated optical scanning system that reads barcodes to identify test base types, eliminating human error while maintaining ease of operation through automatic system control
Solution Approach 2:
The system implements feedback control by scanning the barcode, automatically retrieving the corresponding test base type information, and using this feedback to select and execute the appropriate cleaning process, ensuring high reliability and accuracy
3Manufacturing precision
If multiple cleaning mechanisms are used for different test base types, then cleaning precision is improved, but system complexity increases
Solution Approach 1:
The system achieves universality by designing a multi-functional cleaning platform that can handle different test base types through a single integrated system, where the complexity is managed through automated control rather than multiple separate systems
Solution Approach 2:
The system employs dynamic configuration where cleaning mechanisms and process parameters are dynamically adjusted based on the test base type identified, allowing the system to adapt its complexity level to match the specific cleaning requirements
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Reduces manpower requirements and cleaning hours while minimizing the risk of incorrect cleaning processes, ensuring efficient and accurate cleaning of test bases.
Implementation Method 1
the laser device is used for cleaning the test base
Implementation Method 2
the image capturing device is used for capturing an image of the test base, the image is used for confirming a mounting position of a clamp and for confirming a cleaning result
Data Source
AI summary
A test base cleaning line and a method thereof are provided. The test base cleaning line includes a plurality of cleaning mechanisms, a scanning device, and a moving device. The scanning device is configured for scanning a barcode on a test base to identify a type of the test base, and the moving device is configured for moving the test base to any one of the plurality of cleaning mechanisms according to the type of the test base so that the cleaning mechanism can perform a cleaning operation to the test base.