Semiconductor Test Board With Switchable Paths for eMMC and UFS
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Solution Overview
Problem
Existing test boards struggle to accommodate both eMMC and UFS semiconductor devices due to differing terminal functions and required circuit elements, making it difficult to use a common board for testing.
Innovation Solution
A test board design that includes adjustable connections for terminals and circuit elements, allowing flexible configuration based on the type of semiconductor device, with jumper switches and multiple current paths to accommodate different functions and tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a common test board is used for both eMMC and UFS devices, then device versatility is improved, but circuit configuration complexity increases due to different terminal functions
Solution Approach 1:
The test board employs switchable connections that can be dynamically configured between different circuit elements (resistor, capacitor, inductor, or direct connection) depending on the semiconductor device type being tested. This dynamic reconfiguration capability allows a single test board to adapt its circuit topology for different testing requirements of eMMC and UFS devices without physical modification.
Solution Approach 2:
The test board is designed with multi-functional circuit elements and switchable connections that can serve multiple purposes. The same physical terminals and circuit paths can be configured for different functions (voltage supply, signal transmission, impedance matching) depending on the selected connection mode, enabling universal testing capability for different semiconductor device types.
2Measurement precision
If different circuit elements are connected to voltage supply terminals and signal supply terminals, then testing accuracy is improved, but connection configuration complexity increases
Solution Approach 1:
The test board uses switchable connections that can be dynamically changed based on the specific testing requirements. For voltage supply terminals, the connection can be switched between direct connection and connection through circuit elements (resistor, capacitor, inductor). Similarly, signal supply terminals can be configured with different circuit elements. This dynamic switching enables accurate testing for different device types without manual reconfiguration complexity.
Data Source
AI summary
A test board includes a substrate, a socket mounted on the substrate and including a first connector pin to be connected to a first terminal of a semiconductor device when the semiconductor device is mounted in the socket, a plurality of external terminals through which a voltage or a signal is supplied to the first connector, first and second current paths that can be electrically connected between the first connector pin and one of the plurality of external terminals, and a connection mechanism. The first current path includes a first circuit element. The second current path includes no circuit element or a second circuit element that is different from the first circuit element. The connection mechanism is capable of electrically connecting the first connector pin to one of the plurality of external terminals via one of the first current path and the second current path.