Semiconductor Test Board Load Switching for Multi-DUT Power Control
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Solution Overview
Problem
The increasing complexity of semiconductor device testing in electronic products requires a test board and system capable of handling multiple devices under test (DUT) with varying power requirements and test environments, necessitating improved integration and power supply management.
Innovation Solution
A test board with a substrate that includes load switches controlled by enable signals, allowing for separate test modes on first and second devices under test, and a test controller that manages power distribution and switch states to optimize power supply based on power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple devices under test are simultaneously tested on a test board, then the degree of integration and testing capacity are improved, but the power consumption and power supply requirements increase
Solution Approach 1:
The test board divides multiple devices under test into separate groups, each with its own load switch and enable signal. This segmentation allows independent power control for each device, enabling the system to test multiple devices while managing power consumption by activating only the necessary devices at any given time.
Solution Approach 2:
The patent implements dynamic power supply management where load switches can be individually controlled based on test requirements. The test controller can dynamically activate or deactivate power to specific device groups depending on the testing mode (sequential vs. simultaneous testing), optimizing power usage while maintaining high testing capacity.
2Power
If load switches are controlled by enable signals to activate or deactivate power supply, then power supply management is improved, but the device complexity increases
Solution Approach 1:
The enable signals serve multiple functions: they control the load switches to manage power supply, select which devices are active for testing, and determine the operating mode (sequential or simultaneous). This multi-functionality reduces the need for separate control circuits, managing complexity while improving power supply management.
Solution Approach 2:
The load switches act as intermediary components between the power supply and the devices under test. They mediate the power distribution by responding to enable signals from the test controller, simplifying the overall control architecture while providing precise power management capability.
3Use of energy by moving object
If sequential testing mode is used with load switches, then power consumption is reduced, but the testing time increases
Solution Approach 1:
The system dynamically switches between sequential and simultaneous testing modes based on the test requirements. When power consumption is a constraint, sequential mode activates load switches one at a time. When testing throughput is prioritized, simultaneous mode activates all load switches together. This dynamic adaptability allows optimization of the time-power tradeoff.
Solution Approach 2:
In sequential testing mode, the system employs periodic activation of load switches, testing devices in cycles rather than continuously. This periodic action reduces peak power consumption while maintaining comprehensive testing coverage, accepting the tradeoff of increased total testing time for reduced power requirements.
Data Source
AI summary
Disclosed is a test board which includes a substrate that includes a device under test (DUT) placement area where a first DUT and a second DUT are disposed, a first load switch connected in series with the first DUT and configured to be set to a switch on state or a switch off state based on a first enable signal, a second load switch connected in series with the second DUT and configured to be set to the switch on state or the switch off state depending on a second enable signal, and a test controller. The test controller may be configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal.