Test Board Multiplexer Switches ATE and Mounting Signals
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current automatic test equipment (ATE) for semiconductor integrated circuits primarily measures electrical characteristics and lacks compatibility with mounting tests, making it difficult to exchange or distinguish test items between ATE tests and mounting tests.
Innovation Solution
A test board system comprising multiple boards, where one board simulates the actual operating environment for mounting tests and another performs design for test (DFT) tests, allowing for the selection of different test signals to assess the device under test (DUT) efficiently, reducing the reliance on external ATEs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ATE is used to measure electrical characteristics, then measurement precision is improved, but adaptability deteriorates because mounting tests cannot be performed
Solution Approach 1:
The test board is designed to perform multiple types of tests (ATE tests for electrical characteristics and mounting tests for operational functionality) on the same device under test. The board includes both test equipment interfaces and application circuit configurations, enabling a single device to serve dual purposes: measuring electrical properties and verifying mounting performance in actual operating conditions.
Solution Approach 2:
The patent combines previously separate testing systems into a unified test board. The ATE test interfaces and the mounting test application circuits are integrated onto a single board, allowing both electrical characteristic measurement and operational mounting test to be performed simultaneously or sequentially on the same DUT without requiring separate test equipment.
2Measurement precision
If separate test items are used for ATE and mounting tests, then measurement precision is maintained, but device complexity increases due to difficulty in exchange and compatibility
Solution Approach 1:
The test board is designed to perform multiple types of tests (ATE tests for electrical characteristics and mounting tests for operational functionality) on the same device under test. The board includes both test equipment interfaces and application circuit configurations, enabling a single device to serve dual purposes: measuring electrical properties and verifying mounting performance in actual operating conditions.
Solution Approach 2:
The test board acts as an intermediary platform that bridges the gap between ATE testing and mounting testing. It provides a common interface and configuration environment where both test types can be performed, eliminating the need for separate test items and their associated compatibility issues.
3Reliability
If multiple ATEs are used for comprehensive testing, then reliability is improved, but productivity deteriorates due to increased test time and equipment quantity
Solution Approach 1:
The patent combines previously separate testing systems into a unified test board. The ATE test interfaces and the mounting test application circuits are integrated onto a single board, allowing both electrical characteristic measurement and operational mounting test to be performed simultaneously or sequentially on the same DUT without requiring separate test equipment.
Solution Approach 2:
The test board is designed to perform multiple types of tests (ATE tests for electrical characteristics and mounting tests for operational functionality) on the same device under test. The board includes both test equipment interfaces and application circuit configurations, enabling a single device to serve dual purposes: measuring electrical properties and verifying mounting performance in actual operating conditions.
Data Source
AI summary
A test board includes a first board and a second board. The first board includes a socket on which a device under test (DUT) is mounted, and a first functional circuit. The first functional circuit exchanges signals and data with the DUT in an actual operating environment of the DUT, and performs a first test on the DUT using a first test signal. The first test signal is identical to a signal to be transmitted in the actual operating environment. The second board includes a processor and a multiplexer. The processor performs a second test different from the first test on the DUT using a second test signal. The second test signal is different from the first test signal and checks an electrical characteristic of the DUT itself. The multiplexer selects one of the first test signal and the second test signal to transmit to the DUT.