Test Carrier Movable Valve Through-Hole Contamination Control
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Solution Overview
Problem
Existing test carriers for electronic components with fine pitch terminals face challenges in preventing foreign matter adhesion during testing, as they are assembled in a normal workspace and later disassembled in a clean room, risking contamination of the next process.
Innovation Solution
A test carrier with a movable valve that opens and closes the through hole for sucking and holding the device under test, preventing foreign matter entry by closing the hole when not in use, and allowing suction to hold the component effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a through hole is formed in the lid member for sucking and holding the DUT, then the DUT can be positioned and held with high accuracy, but foreign matter can enter through the through hole and adhere to the DUT
Solution Approach 1:
The lid member is designed to move between a closed state (blocking the through hole) and an open state (allowing suction). During transport and storage, the lid member remains closed to prevent foreign matter entry. During the sucking and holding operation, the lid member opens to allow the through hole to function, then closes again afterward to protect the DUT from contamination.
Solution Approach 2:
The lid member is closed before the sucking operation to prevent foreign matter from entering the through hole. This preliminary protective action ensures that the DUT remains clean during transport and storage, and only opens when the sucking operation is actively performed.
2Reliability
If the test carrier is disassembled in a clean room to remove the DUT, then the DUT can be safely removed, but foreign matter that adhered during testing can be brought into the next process
Solution Approach 1:
The lid member remains closed after the sucking operation to contain any foreign matter that may have entered during testing. This dynamic closure prevents foreign matter from being transferred to the next process when the DUT is removed, even if the disassembly occurs in a clean room environment.
Solution Approach 2:
The through hole, which initially serves as a pathway for foreign matter entry, is converted into a beneficial feature by using it for precise positioning and suction operations. The movable lid member then compensates for the potential harm by closing to prevent contamination during non-operational phases.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The movable valve effectively suppresses foreign matter adhesion to the device under test, ensuring cleanliness and preventing contamination in subsequent processes by controlling the through hole's openness based on suction status.
Implementation Method 1
a movable valve that opens and closes the through hole in accordance with a suction of the through hole, in which when the through hole is sucked, the movable valve opens the through hole, and when the through hole is not sucked, the movable valve closes the through hole
Data Source
AI summary
A test carrier that accommodates a device under test (DUT) and has a through-hole facing the DUT, including: a movable valve that: opens by suction through the through hole such that the DUT is sucked through the through hole.