Test Case Function Mapping via Trace Sampling

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Solution Overview

Problem

Current information handling systems face inefficiencies in regression testing due to the time-consuming nature of running all test cases, and challenges in determining code coverage for embedded systems without external debug equipment.

Innovation Solution

An information handling system that automatically generates code function and test case mapping by repeatedly sampling trace logs, allowing for efficient regression testing and eliminating the need for external debug equipment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If all test cases are run for regression testing, then code coverage is improved, but testing time increases

Engineering Contradiction:

Improvecode coverageVSAvoidtesting time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the test case execution process by using trace switch values to divide trace logs into different segments corresponding to different code functions. This allows selective mapping of test cases to specific functions, enabling efficient regression testing by running only relevant test cases for changed functions rather than executing all test cases, thus reducing testing time while maintaining code coverage for critical areas

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent applies partial action by generating trace logs with different trace switch values to obtain sufficient information for mapping test cases to code functions without requiring complete execution of all possible test scenarios. This partial sampling approach provides adequate code coverage information while significantly reducing the overall testing time and computational resources required

Inventive Principle:

Principle #16Partial or excessive action

2Measurement precision

If external debug equipment is used for embedded systems testing, then measurement precision is improved, but device complexity increases

Engineering Contradiction:

Improvecode coverage measurementVSAvoidtesting equipment

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements self-service by enabling embedded systems to generate their own trace logs internally using trace switch values without requiring external debug equipment. The system automatically maps these trace logs to code functions and generates test case mappings, making the testing process self-sufficient and eliminating the need for complex external hardware while maintaining measurement precision through automated trace analysis

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The patent introduces trace logs as an intermediary mechanism that captures execution information internally within the embedded system. These trace logs serve as a mediator between the code execution and the testing analysis process, allowing precise measurement of code coverage without direct intervention from external debug equipment, thus reducing device complexity while preserving measurement accuracy

Inventive Principle:

Principle #24Intermediary (Mediator)

Data Source

PatentUS12222850B2Automatic generation of code function and test case mapping

Publication Date: 2025.02.11 DELL PROD LP

AI summary

An information handling system executes test cases against a code that includes a set of functions, wherein the execution is performed at least twice using a different trace switch value. The system also identifies trace logs associated with each test case, and maps each test case to one or more functions based on the association of the trace logs with each test case.