Temperature Test Chamber Airflow Zoning for Uniform DUT Heating

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Solution Overview

Problem

Conventional testing apparatuses for data storage devices suffer from uneven temperature distribution during simultaneous temperature testing, leading to inconsistent results due to varying temperatures at different locations within the testing chamber.

Innovation Solution

The testing apparatus employs horizontally stacked fluid flow zones with adjustable intake and exhaust dampers, recirculation modes, and temperature control systems to ensure uniform fluid flow and temperature maintenance across multiple devices under test, using channels in the door to direct fluid flow evenly across devices and separate control of temperature sensors to maintain target temperatures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple devices are simultaneously tested in a conventional testing chamber, then testing productivity increases, but temperature uniformity deteriorates leading to inconsistent test results

Engineering Contradiction:
Improvetesting throughputVSAvoidtemperature uniformity
Core Design Contradiction:
ProductivityVSTemperature

Solution Approach 1:

The testing chamber is divided into multiple zones with independent temperature control. Each zone contains heating elements and temperature sensors that can be independently adjusted, allowing different regions to maintain optimal temperatures for different device types or testing requirements, thereby achieving both high throughput and temperature uniformity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically adjusts temperature parameters across different zones based on real-time sensor feedback. The controller modifies heating power, air circulation rates, and zone boundaries to maintain consistent temperatures throughout the chamber even when testing multiple devices simultaneously, resolving the contradiction between productivity and temperature uniformity

Inventive Principle:
Principle #35Parameter changes

2Speed

If temperature is increased to accelerate testing, then testing speed improves, but device reliability deteriorates due to excessive heat

Engineering Contradiction:
Improvetesting speedVSAvoiddevice reliability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The testing apparatus employs dynamic temperature adjustment where the temperature profile changes during the testing process. Devices undergo accelerated testing at elevated temperatures for specific time intervals, then are cooled or moved to lower temperature zones, allowing speed improvement while preventing thermal damage through continuous adaptation of temperature conditions

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system implements periodic cycling between high-temperature acceleration phases and cooling phases. Devices are subjected to elevated temperatures for controlled periods to accelerate testing, then allowed to cool or transition to different thermal environments, maintaining reliability while achieving faster test cycles through repeated thermal cycling

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design achieves consistent temperature control across multiple devices, reducing temperature variances and ensuring reliable quality control and performance testing of data storage devices by providing uniform fluid flow and precise temperature management.

Implementation Method 1

The interior chamber is divided into a plurality of fluid flow zones, each of which includes a plurality of devices under test arranged in a row. The testing apparatus employs horizontally stacked fluid flow zones with adjustable intake and exhaust dampers, recirculation modes, and temperature control systems to ensure uniform fluid flow and temperature maintenance across multiple devices under test

Methodology Applied
Scientific EffectConvection: Convection

Implementation Method 2

The testing apparatus employs horizontally stacked fluid flow zones with adjustable intake and exhaust dampers, recirculation modes, and temperature control systems to ensure uniform fluid flow and temperature maintenance across multiple devices under test, using a controller to manage fans, heaters, and dampers for precise temperature regulation

Methodology Applied
Scientific EffectHeating: Heating

Data Source

PatentUS11828793B2Testing apparatus for temperature testing of electronic devices
Publication Date: 2023.11.28 SANDISK TECHNOLOGIES LLC
  • US11828793B2 patent drawing
  • US11828793B2 patent drawing
  • US11828793B2 patent drawing

AI summary

A testing apparatus for Devices Under Test (DUTs) includes at least one intake damper and at least one exhaust damper. At least one fan moves recirculated fluid and exterior fluid across one or more DUTs inside the testing apparatus. In one aspect, the testing apparatus includes a door to provide access to a chamber and the door includes at least one channel. At least a portion of the fluid flows through the at least one channel of the door. In another aspect, the door is configured to provide access to a chamber from the front of the chamber and the fluid is moved in a direction across the one or more DUTs substantially from the front of the chamber towards a rear of the chamber.