Test Circuit Bypasses Shift Register for AMOLED Aging
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Solution Overview
Problem
In AMOLED display panels, the process of aging transistors to reduce leakage current damages the shift register unit, preventing effective aging and normal displaying due to high voltage and opposite direction signals that must pass through the unit.
Innovation Solution
A test circuit with signal input terminals and control signal terminals connected to switches, allowing signals to be input directly to the display panel without passing through the shift register unit, using switch transistors to control signal flow and prevent damage during the aging process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If aging signals are input through the shift register unit, then transistor aging can be performed, but the shift register unit cannot output effective aging signals and normal displaying is affected
Solution Approach 1:
The patent separates the aging function from the normal display operation by creating an independent test signal input channel. This allows the aging process to be performed independently without interfering with the shift register unit's normal operation, ensuring both productivity and ease of operation.
Solution Approach 2:
The display panel is designed with multi-functionality, supporting both normal display operation through the shift register unit and aging testing through the direct test signal input channel. This universal design allows the same display panel to perform multiple functions without compromising either function.
2Manufacturing precision
If high voltage aging signals are applied to reduce transistor leakage current, then bright point defects in black frame are eliminated, but the shift register unit suffers damage from the same signals
Solution Approach 1:
The patent introduces a dedicated test signal input terminal as an intermediary that provides a safe path for applying high voltage aging signals. This intermediary channel isolates the harmful aging signals from the shift register unit while still allowing them to reach the display region for effective aging, eliminating bright point defects without causing damage.
Solution Approach 2:
The patent extracts the aging signal input function from the normal signal input path through the shift register unit. By creating a separate direct connection from the test signal input terminal to the display region, the harmful aging signals are taken out of the shift register unit's signal path, preventing damage while maintaining display quality.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables normal detection and aging of transistors without damaging the shift register unit, ensuring normal displaying functions by controlling signal flow through the test circuit, avoiding damage from high voltage aging signals.
Implementation Method 1
a switch particularly comprises a switch transistor, a gate of which is connected to a corresponding control signal terminal, a source of which is connected to a corresponding signal input terminal, and a drain of which is configured to output a signal input by the corresponding signal input terminal
Data Source
AI summary
Embodiments of the present disclosure provide a test circuit, a test method, a display panel and a display apparatus. Each of the signal input terminals may input a plurality of signals in a time division multiplexed manner, and in turn may be controlled by the corresponding switches to form a plurality of signal lines, a signal flow of the plurality of signal lines are totally different from each other under control of the switches. For example, one of the signal lines may function as a signal input line, and the other one of the signal lines may function as a signal input line for other specific testing, such as aging process so as to input signals different from the normal turn-on state signals. Consequently, by controlling the corresponding switches through the control signal terminals so that different input signals pass through different signal lines into the display panel to meet testing requirements of normal turn-on state testing, aging process and so on for the display panel. With respect to the prior art, the testing signals may be input without passing through a shift register unit, which avoids damage of a specific testing signal such as aging signal on the shift register unit and ensure a normal displaying function of the display panel.