Test Circuit Array With Switch And Voltage-Setting Unit
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Solution Overview
Problem
When testing multiple devices-under-test that share the same input/output pad, unwanted interference occurs due to leakage paths, reducing the accuracy of test results, especially as the number of devices increases.
Innovation Solution
A test circuit array with each test circuit comprising a pull-up device, a pull-down device, a switch unit, and a voltage-setting unit, where the switch unit is controlled by a switch signal and the voltage-setting unit is controlled by a third control signal to pull the second end of the device-under-test to a predetermined voltage, allowing for independent testing paths and reducing interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If multiple devices-under-test share the same testing pad, then the number of input/output pads can be reduced, but interference between test paths occurs via leakage paths reducing test accuracy
Solution Approach 1:
The patent divides the shared testing pad into multiple independent test paths by introducing switch units. Each device-under-test has its own dedicated switch unit that can independently connect or disconnect its test path from the shared pad, effectively segmenting the shared resource into isolated channels that prevent leakage interference between devices.
Solution Approach 2:
The patent introduces switch units as intermediary components between the shared testing pad and each device-under-test. These switch units act as mediators that control the connection state of each test path, enabling selective isolation of devices not under test and preventing leakage currents from affecting active test paths.
2Reliability
If switches are disposed between the testing pad and each device-under-test to disconnect test paths, then device isolation is improved, but unwanted interference via leakage paths still occurs
Solution Approach 1:
The patent applies local quality by introducing voltage-setting units at each device-under-test that can independently set the voltage potential at the device end. This local voltage control creates different electrical conditions for different devices, suppressing leakage currents at their respective locations and preventing them from affecting other test paths through the shared pad.
Solution Approach 2:
The patent changes the voltage parameter at each device-under-test by using voltage-setting units that can adjust the potential at the device end. By dynamically adjusting these voltage parameters, the patent suppresses leakage currents and eliminates interference paths, thereby improving measurement accuracy while maintaining device isolation.
3Productivity
If the number of devices-under-test sharing the same testing pad increases, then testing capacity is improved, but interference between test paths becomes more significant
Solution Approach 1:
The patent segments each test path with dedicated switch units and voltage-setting units, allowing multiple devices to be tested through a shared pad without interference. This segmentation enables independent control of each device's electrical state, suppressing leakage currents regardless of how many devices are connected to the shared pad.
Solution Approach 2:
The patent uses voltage-setting units to dynamically adjust voltage parameters at each device-under-test, creating localized electrical conditions that suppress leakage currents. This parameter control mechanism remains effective even as the number of shared devices increases, maintaining test accuracy while scaling testing capacity.
Data Source
AI summary
A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.