Test Circuit Voltage Adjustment for Display Panel Pixel Testing

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Solution Overview

Problem

Display devices face challenges in testing display areas where electronic modules are disposed, leading to potential performance degradation due to reduced pixel density and light transmittance, which can result in incorrect identification of pixels as defective during testing.

Innovation Solution

A display device with a test circuit that differentiates between pixels in areas of varying light transmittance, providing distinct test data signals to pixels in different driving modes to minimize errors in pixel testing, while maintaining operational efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a camera module is disposed in the image display area to increase display functionality, then the electronic module integration is improved, but the pixel density and light transmittance in the overlapping area are reduced

Engineering Contradiction:

Improveelectronic module integrationVSAvoidpixel density

Core Design Contradiction:

Adaptability or versatilityVSQuantity of substance

Solution Approach 1:

The display panel is divided into a first area with higher light transmittance (where the camera module is disposed) and a second area with lower light transmittance. This segmentation allows different regions to have optimized characteristics for their specific functions, enabling the camera module to be integrated without compromising overall display performance.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Different areas of the display panel are assigned different light transmittance properties. The first area overlapping with the electronic module has higher light transmittance to accommodate the module, while the second area has lower light transmittance for normal display purposes. This local differentiation resolves the contradiction by allowing electronic module integration while maintaining display quality in non-overlapping areas.

Inventive Principle:

Principle #3Local quality

2Device complexity

If pixels in the first area with higher light transmittance are tested using the same test data signal as pixels in the second area, then the testing process is simplified, but the pixel testing accuracy deteriorates due to different light transmittance characteristics

Engineering Contradiction:

Improvetesting process complexityVSAvoidpixel testing accuracy

Core Design Contradiction:

Device complexityVSMeasurement precision

Solution Approach 1:

The test circuit provides different test data signals to pixels in the first area versus pixels in the second area. Specifically, pixels in the first area receive a first test data signal with a first voltage level, while pixels in the second area receive a second test data signal with a second voltage level. This local differentiation ensures that testing accuracy is maintained for both areas despite their different light transmittance characteristics.

Inventive Principle:

Principle #3Local quality

Solution Approach 2:

The test circuit changes the voltage level parameter of the test data signal based on the pixel area being tested. By adjusting the voltage level according to the light transmittance characteristics of different areas, the testing accuracy is maintained without requiring complete process redesign.

Inventive Principle:

Principle #35Parameter changes

3Device complexity

If a single test data signal voltage level is used for all pixels, then the test circuit design is simplified, but the testing reliability deteriorates due to varying light transmittance across different areas

Engineering Contradiction:

Improvetest circuit design complexityVSAvoidtesting reliability

Core Design Contradiction:

Device complexityVSReliability

Solution Approach 1:

The test circuit is designed to provide different voltage levels to different areas: a first voltage level for pixels in the first area (higher light transmittance) and a second voltage level for pixels in the second area (lower light transmittance). This local quality approach ensures testing reliability is maintained across both areas while keeping the circuit design as simple as possible given the requirements.

Inventive Principle:

Principle #3Local quality

Solution Approach 2:

The test circuit dynamically adjusts the voltage level of test data signals based on which area is being tested. The circuit can switch between providing a first voltage level for the first area and a second voltage level for the second area, enabling reliable testing without requiring a completely complex multi-circuit design.

Inventive Principle:

Principle #15Dynamics

Data Source

PatentUS11749178B2Display device for providing test data signals of different voltage levels to different areas of a display panel in a test mode

Publication Date: 2023.09.05 SAMSUNG DISPLAY CO LTD

AI summary

A display device that includes: a display panel including a plurality of pixels respectively connected to a corresponding data line of a plurality of data lines and a corresponding scan line of a plurality of scan lines; and a test circuit connected to the data lines, and wherein the display panel includes a first area having a first light transmittance and a second area having a second light transmittance, wherein the pixels include a first pixel in the first area and a second pixel in the second area, wherein the test circuit provides a first test data signal to a data line connected to the first pixel, and provides a second test data signal to a data line connected to the second pixel, and wherein a voltage level of the first test data signal is different from a voltage level of the second test data signal.