Test Device Error Detection for Semiconductor Memory Reliability
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Solution Overview
Problem
Conventional semiconductor memory device test devices face reliability issues due to simultaneous activation of test signals, leading to errors such as shorting of internal voltages, which can incorrectly identify normal memory chips as defective.
Innovation Solution
A test device with an error detecting unit that generates flags to identify errors in input test signals, allowing a normal test unit to output internal voltages correctly when no errors are detected and an error information providing unit to indicate errors by outputting a ground voltage when errors occur, preventing incorrect voltage outputs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If concurrent test mode is used to perform multiple tests simultaneously, then test productivity is improved, but test reliability deteriorates due to potential simultaneous activation of test signals causing voltage shorting
Solution Approach 1:
The patent applies preliminary action by detecting test signal activation states before executing test operations. The detection unit checks which test signals are activated prior to voltage output, preventing simultaneous activation of conflicting signals. This advance detection ensures that only one test signal is processed at a time, eliminating voltage shorting risks while maintaining the capability to perform multiple tests through sequential execution.
2Speed
If test signals are simultaneously activated for concurrent testing, then test speed is improved, but harmful factors increase due to shorting of internal voltages
Solution Approach 1:
The patent applies preliminary anti-action by implementing a detection mechanism that identifies simultaneous test signal activation before harmful voltage shorting can occur. When the detection unit identifies that multiple test signals are activated concurrently, it prevents the voltage output unit from operating, thereby counteracting the potential harmful effect before it manifests. This approach maintains fast test execution by quickly detecting and preventing errors rather than allowing them to propagate.
3Device complexity
If conventional test device outputs internal voltages based on test signals without error detection, then device complexity is reduced, but measurement precision deteriorates due to inability to distinguish erroneous signals
Solution Approach 1:
The patent introduces an intermediary detection unit between the test signal input and voltage output stages. This intermediary component analyzes the activation state of test signals and determines whether they are valid or erroneous before allowing voltage output. The detection unit acts as a mediator that filters out erroneous simultaneous activations, ensuring that only valid test signals trigger appropriate voltage outputs, thereby significantly improving measurement precision with minimal additional complexity.
Data Source
AI summary
A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag is deactivated, and an error information providing unit indicates the error of the test signals when the error flag is activated.