Test Device Segmentation for Electrical Module Parallel Testing
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Solution Overview
Problem
Existing test devices for electrical modules can only test one module at a time, leading to inefficiencies in testing multiple modules simultaneously and long changeover times for module replacement.
Innovation Solution
A test device with movable support members and dual module receiving units allows for simultaneous testing of multiple modules, with one unit accessible for replacement without changing the device's position, enabling direct electrical connection between modules without additional circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single module receiving unit is used in the test device, then the device complexity is reduced and ease of operation is improved, but productivity decreases because only one module can be tested at a time
Solution Approach 1:
The test device is segmented into multiple independent module receiving units (first module receiving unit and second module receiving unit), each capable of independently accommodating and testing a module. This segmentation allows parallel testing of multiple modules, thereby increasing productivity without requiring a completely new test device design.
Solution Approach 2:
The test device is designed with universal module receiving units that can accommodate different types of modules (e.g., camera modules, sensor modules, display modules) through standardized interfaces. This multi-functionality allows the same test device structure to handle various module types simultaneously, increasing productivity without proportionally increasing device complexity.
2Loss of time
If a single module receiving unit is used, then device complexity is reduced, but changeover time increases because module replacement requires device repositioning
Solution Approach 1:
The module receiving units are segmented into independently accessible positions (first module receiving unit and second module receiving unit). The second module receiving unit is specifically designed to be permanently accessible without requiring repositioning of the entire test device, allowing rapid module replacement while maintaining ease of operation.
Solution Approach 2:
The test device is pre-configured with multiple module receiving units in different accessibility positions before testing begins. The permanently accessible second module receiving unit is prepared in advance to accept module replacements without requiring device repositioning, thereby reducing changeover time while maintaining operational simplicity.
3Productivity
If modules are tested sequentially in a single receiving unit, then device structure is simplified, but productivity decreases due to inability to test multiple modules simultaneously under same conditions
Solution Approach 1:
The test device incorporates multiple module receiving units that are simultaneously exposed to identical test conditions (temperature, humidity, vibration, etc.). Each receiving unit is segmented to independently hold a module while all units experience the same environmental parameters, enabling parallel testing that maintains condition consistency and increases productivity.
Solution Approach 2:
Multiple module receiving units are merged into a single test device structure that applies uniform test conditions to all units simultaneously. This combining approach allows multiple modules to be tested in parallel under identical conditions, ensuring reliability through consistent test parameters while achieving high productivity through simultaneous testing.
Data Source
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AI summary
One aspect concerns a test device (10) for testing electrical modules (24, 26, 28), comprising: a first support member (12) and a second support member (14), which are movable relative to each other and are arranged opposite each other in an operating position of the test device for testing the electrical modules (24, 26, 28); an inner module receiving unit (18) arranged on the first support member (12) for electrically contacting a module (24) to be tested, wherein the inner module receiving unit (18) is inaccessible in the operating position for exchanging the module (24) to be tested;and at least one permanently accessible module receiving unit (20, 22) for electrically contacting another module (26, 28) to be tested, wherein the at least one permanently accessible module receiving unit (20, 22) is arranged on the test device (10) such that the at least one permanently accessible module receiving unit is accessible in the operating position for exchanging the module (26, 28) to be tested, and wherein the inner module receiving unit (18) and the at least one permanently accessible module receiving unit (20, 22) are configured to electrically connect the modules (24, 26, 28) to be tested to the test device.