Test Device Switch Control for Noise Filtering
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Solution Overview
Problem
Conventional test devices face low reception sensitivity due to noise generated by other components of the test object, especially in semiconductor structures with irregular wiring density, which reduces the accuracy of detecting test target points.
Innovation Solution
A test device comprising multiple transceivers that transmit and receive waves, a combiner to combine signals, and switches to selectively transfer signals with low noise levels, controlled by a switch control unit to block noisy signals, allowing for focused wave transmission and reception, even in multilayer structures with varying wiring densities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple transceivers transmit waves to a test target point, then reception sensitivity should improve, but noise from other components increases
Solution Approach 1:
The patent segments the signal processing by introducing switches for each transceiver channel, allowing individual control of signal paths. This enables selective combination of signals from different transceivers, separating useful reflected waves from noisy components generated by other parts of the test object.
Solution Approach 2:
The patent extracts and removes noisy signals from the combined signal path by using switches to block signals from transceivers that receive dominant noise from other components. This extraction principle isolates the clean signals containing actual test target information from the harmful noise.
2Power
If all received signals are combined, then signal strength increases, but noise level increases
Solution Approach 1:
The patent introduces dynamic control of signal combination through switches that can be opened or closed based on noise levels. This dynamic approach allows the system to adaptively combine signals only from transceivers with acceptable noise levels, rather than statically combining all signals regardless of noise content.
Solution Approach 2:
The patent changes the parameter of signal combination by introducing a selection mechanism that varies which transceiver signals are combined. The switch control unit adjusts the combination parameters based on noise characteristics, allowing optimal signal strength while maintaining acceptable noise levels.
3Measurement precision
If switches are added to selectively block signals, then noise filtering improves, but device complexity increases
Solution Approach 1:
The patent makes the switches and control unit serve multiple functions: they not only filter noise but also dynamically adjust signal combination to optimize reception sensitivity for different test target points. This multi-functionality justifies the added complexity by providing multiple benefits from the same components.
Solution Approach 2:
The switch control unit implements feedback by monitoring noise levels from each transceiver and automatically adjusting the switch states to block noisy signals. This closed-loop control automates the noise filtering process, reducing the need for manual intervention and complex wiring configurations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances reception sensitivity by selectively filtering out noise, resulting in high-quality combined signals that accurately reflect the test target point, improving imaging and defect detection in semiconductor devices.
Implementation Method 1
a plurality of transceivers configured to respectively transmit a wave to a test target point of a test object, to respectively receive a wave reflected, scattered, and/or refracted from the test object
Implementation Method 2
a plurality of transceivers configured to respectively transmit a wave to a test target point of a test object, to respectively receive a wave reflected, scattered, and/or refracted from the test object
Implementation Method 3
a plurality of transceivers configured to respectively transmit a wave to a test target point of a test object, to respectively receive a wave reflected, scattered, and/or refracted from the test object
Implementation Method 4
each of the transceivers may include a piezoelectric element that receives the reflected, scattered, or refracted wave from the test object and converts the received wave into an electric signal
Implementation Method 5
each of the transceivers may include a photoelectric element that receives the reflected, scattered, or refracted wave from the test object and converts the received wave into an electric signal
Data Source
AI summary
A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.