Test Element Z-Position Detection Using Opaque Light Limiting
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing analysis systems struggle to accurately detect incorrect positioning of test elements in the Z-direction, which can lead to erroneous analysis results, especially when test elements bend within the holder.
Innovation Solution
A method involving a test element holder and analysis unit that uses irradiation with analysis and control light sources, where a delimiting element with an opaque area blocks scattered or reflected light from reaching the detector if the test element is incorrectly positioned in the Z-direction, allowing for detection of incorrect positioning by comparing detection signals with a predetermined limit value.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a test element holder is used to position the test element, then the test element can be held in place, but incorrect positioning in the Z-direction cannot be detected
Solution Approach 1:
The patent performs a position check before the actual sample analysis by irradiating the analysis area with control light and detecting the scattered or reflected light. This preliminary detection of incorrect positioning in the Z-direction prevents erroneous analysis results while maintaining the simplicity of the holder structure.
Solution Approach 2:
The patent introduces control light as an intermediary to detect positioning accuracy. The control light serves as a mediator between the holder positioning mechanism and the analysis system, allowing indirect detection of Z-direction positioning errors through light scattering or reflection patterns.
2Ease of operation
If the test element is held at both ends by a pin and hold-down device, then the test element is secured, but the analysis area may be positioned incorrectly in the Z-direction if the test element bends
Solution Approach 1:
The system performs a preliminary position check using control light irradiation before sample analysis to detect bending-induced positioning errors. This allows the holder to maintain its simple two-point securing mechanism while adding a detection step that identifies when bending causes Z-direction positioning errors.
Solution Approach 2:
The detection system provides feedback about the actual position of the analysis area by measuring light scattering or reflection from the control light. This feedback mechanism allows the system to recognize when the test element has bent and the analysis area is no longer correctly positioned, even though the holder structure remains unchanged.
3Measurement precision
If light scattering or reflection is used to detect positioning, then positioning can be checked, but light intensity may not be sufficient for accurate detection
Solution Approach 1:
The patent uses control light as an intermediary illumination source specifically for position detection. This separate control light path allows optimization of detection lighting without affecting the main analysis lighting, providing sufficient intensity for accurate positioning detection through controlled scattering or reflection measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces light intensity and ensures accurate detection of incorrect positioning in the Z-direction, preventing falsification of analysis results and enhancing the precision of sample analysis.
Implementation Method 1
detecting light scattered or reflected at the analysis area by a detector to obtain detection signals
Implementation Method 2
detecting light scattered or reflected at the analysis area by a detector to obtain detection signals
Implementation Method 3
a delimiting element with an opaque area blocks scattered or reflected light from reaching the detector if the test element is incorrectly positioned in the Z-direction
Data Source
Figure 1
Figure 2A~2B
Figure 3
AI summary
The invention relates to a method for analyzing a sample on a test element (1) in an analysis system (9) with a test element holder (13) and an analysis unit (10), comprising checking whether an analysis area (2) of the test element (1) in the test element holder (13) is positioned in an analysis position relative to the analysis unit (10), wherein the checking comprises the steps of irradiating the analysis area (2) with light from at least one light source (11), detecting light scattered or reflected at the analysis area (2) by a detector (12) to obtain detection signals, and evaluating the detection signals by an evaluation unit.This involves limiting a transparent area (14) arranged between the test element (1) and the detector (12) by a limiting element (15) which has an opaque area (16), wherein the limiting element (15) is positioned relative to the light source (11) and the detector (12) such that, at an analysis area (2) of a test element (1) arranged in the test element holder (13) in a misaligned position in the Z-direction, scattered or reflected light substantially hits the opaque area (16) and does not reach the detector (12), and by comparing the detection signals with at least one predetermined limit value to detect a misalignment in the Z-direction when the limit value is undershot.