Test Fixture Assembly for 5G Antenna Module Verification
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Solution Overview
Problem
Conventional methods for verifying 5G millimeter wave antenna packages require a separate carrier board, leading to increased testing time and cost.
Innovation Solution
A test fixture assembly comprising a circuit board with test pads and a socket unit with socket probes, where the socket probes are inserted through a socket base and connected to both the pins of the Device Under Test (DUT) and the test pads, allowing for direct electrical connection and efficient testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a separate carrier board is used to electrically connect the pins of the module to the test equipment, then the connection is stable and reliable, but the testing time and cost increase
Solution Approach 1:
The patent extracts the essential function of electrical connection from the complex carrier board system and implements it through simple socket probes that directly contact the pins. The socket probes are inserted through the antenna module housing to establish electrical connections with the pins, eliminating the need for a separate carrier board while maintaining connection reliability and significantly reducing testing time
Solution Approach 2:
The socket probes serve as intermediaries between the antenna module pins and the test equipment. These probes transmit electrical signals directly from the pins to the test equipment without requiring a carrier board, thus maintaining signal integrity and connection reliability while simplifying the testing setup and reducing testing time
2Reliability
If a separate carrier board is used to electrically connect the pins of the module to the test equipment, then the connection is stable and reliable, but the testing cost increases
Solution Approach 1:
The patent extracts the essential function of electrical connection from the expensive carrier board system and implements it through simple, low-cost socket probes. The probes are inserted through the antenna module housing to establish direct electrical connections with the pins, eliminating the need for costly carrier boards while maintaining connection reliability
Solution Approach 2:
The socket probes used in this invention are simple, inexpensive components that can be easily replaced if needed. They serve as disposable or easily renewable connection elements, replacing the expensive carrier board while maintaining reliable electrical connections throughout the testing process
3Reliability
If conventional verification methods are used with a carrier board, then all pins can be tested, but the verification process is time-consuming and costly
Solution Approach 1:
The patent extracts the verification function from the complex carrier board setup and implements it through direct socket probe connections. The probes are inserted through the antenna module housing to contact the pins, enabling quick and accurate verification of individual antenna elements without the overhead of a full carrier board system
Solution Approach 2:
The verification process is segmented into individual antenna element tests. The socket probes allow for targeted testing of specific pins corresponding to individual antenna elements, enabling efficient verification without needing to test all pins simultaneously as required by conventional carrier board methods
Data Source
AI summary
A test fixture assembly is for performing a test of a DUT (Device under Test), the DUT includes a plurality of pins exposed on a surface of the DUT, and the test fixture assembly includes a circuit board and a socket unit. The circuit board includes a plurality of test pads, which are exposed on a surface of the circuit board. The socket unit includes a socket base and a plurality of socket probes, which are inserted through the socket base. A first end and a second end of each of the socket probes are respectively exposed on two opposite surfaces of the socket base. Each of the test pads, a corresponding one of the socket probes and a corresponding one of the pins are configured to be linearly arranged along a socket probe direction.