Test Fixture Probe Verification via Shorting Plate
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Solution Overview
Problem
The manual replacement of test probes in electronic circuit test systems is prone to errors due to the large number of probes, leading to incorrect installation and potential damage to printed circuit board assemblies (PCBAs) during testing.
Innovation Solution
An automated verification method using a test fixture with headed and headless test probes, a conductive shorting plate, and a verification plate with specific apertures to ensure correct probe placement, which includes executing shorted probe, probe presence, and probe verification tests to identify any defective or missing probes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of repair
If manual replacement of test probes is performed, then the test fixture can be maintained and reused, but errors and mistakes occur during maintenance operations
Solution Approach 1:
The system performs self-verification by automatically detecting probe types and locations through electrical continuity testing. The test equipment itself checks its own configuration without requiring manual verification, reducing human error while maintaining ease of repair through automated diagnostics.
Solution Approach 2:
The system provides immediate feedback about probe installation correctness by measuring electrical continuity and comparing it against expected patterns. This feedback mechanism allows operators to quickly identify and correct errors, improving reliability while maintaining ease of repair through guided troubleshooting.
2Productivity
If thousands of test probes are used in a large matrix, then comprehensive testing capability is achieved, but the complexity of maintenance and verification increases
Solution Approach 1:
The patent replaces manual mechanical verification processes with automated electrical testing. Instead of physically inspecting each probe's position and type, the system uses electrical continuity measurements to automatically verify probe configuration, dramatically reducing the complexity of maintaining large probe matrices while preserving comprehensive testing capability.
Solution Approach 2:
The verification system serves multiple functions: it identifies probe types, verifies probe locations, detects missing probes, and validates overall fixture configuration. This multi-functional approach consolidates what would otherwise require multiple separate verification processes into a single automated system, reducing operational complexity.
3Reliability
If incorrect test probes are installed in the test fixture, then false test results or damage to PCBA may occur, but detecting incorrect probe installation is particularly difficult
Solution Approach 1:
The system replaces difficult visual or manual inspection methods with automated electrical continuity testing. By measuring electrical paths through the probe tips and comparing them against expected patterns, the system easily detects incorrect probe installations that would be extremely difficult to identify through traditional inspection methods.
Solution Approach 2:
The patent introduces an intermediary verification system that acts as a mediator between probe installation and actual testing. This intermediate check uses electrical continuity measurements to verify probe correctness before real testing begins, preventing false results or damage while making detection of errors straightforward through automated diagnostics.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method ensures accurate and efficient verification of test probe installation, reducing errors and preventing damage to PCBAs by identifying and correcting incorrect or missing probes, thereby ensuring reliable test results.
Implementation Method 1
providing a conductive shorting plate
Implementation Method 2
Each aperture has a perimeter dimension or orientation that allows the headless probe to pass through the aperture, but prevents the headed probe from passing through the aperture
Data Source
AI summary
A method provides testing of an electronic circuit test system that includes a test fixture having headed and headless test probes, a shorting plate and a test probe verification plate with apertures. A probe verification test includes: moving the test probe verification plate and the shorting plate into position, where the shorting plate engages any test probe that extends through an aperture of the verification plate; and transmitting an electrical signal to each of the test probes. The electricity flow associated with each of the test probes is analyzed to determine if any of the headless test probes have an open circuit. In response to detecting an open circuit: one or more of the headless test probes are indicated as (a) defective in the test fixture or (b) missing from the test fixture; and the specific locations in the test fixture of the defective or missing test probes are identified.