Test Handler Insert With Detachable Pocket For Semiconductor Testing
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Solution Overview
Problem
Existing test handler systems have low resource reuse rates due to damage-prone hooks and complex, difficult-to-install latch mechanisms, requiring replacement of entire inserts or parts when semiconductor devices of different sizes are tested.
Innovation Solution
The design includes a detachable insert pocket with hooks and latch apparatuses that can be easily replaced or repaired, allowing the insert body to be reused, and a configuration of holes and position grooves to accommodate different sized semiconductor devices without replacing the insert.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the hook mechanism is made robust and integrated into the insert body, then the reliability of the insert is improved, but the cost and complexity of replacing the entire insert increases when the hook is damaged
Solution Approach 1:
The insert is divided into two separable components: the insert body (containing the hook mechanism) and the insert pocket (containing the latch mechanism). This segmentation allows the insert pocket to be replaced independently when damaged, without replacing the entire insert or the insert body, thereby reducing replacement complexity and cost while maintaining overall system reliability.
2Stability of the object's composition
If the latch mechanism is integrated into the insert body, then the structural stability is improved, but the ease of repair and replacement deteriorates due to small and complicated parts
Solution Approach 1:
The latch mechanism is segregated into the insert pocket, which is a separate replaceable component from the insert body. This allows the latch mechanism to be easily removed and replaced by simply detaching the insert pocket, avoiding the complexity of disassembling and repairing small parts integrated into the insert body, while maintaining structural stability through the hook-receiving groove connection.
3Ease of manufacture
If the insert is designed as a single integrated unit, then the manufacturing simplicity is improved, but the resource reuse rate deteriorates when semiconductor devices of different sizes are tested
Solution Approach 1:
The insert is segmented into the insert body and insert pocket, allowing the insert body to be retained and reused while only the insert pocket needs to be replaced when accommodating different semiconductor device sizes. This significantly improves the resource reuse rate compared to a fully integrated design where the entire insert would need replacement.
Solution Approach 2:
The insert body is designed with universal features including hook receiving grooves and latch apparatuses that can accommodate multiple types of insert pockets for different semiconductor device sizes. This multi-functionality allows a single insert body to serve multiple purposes across different testing scenarios, enhancing adaptability and resource reuse.
Data Source
AI summary
An insert for a carrier board of a test handler is disclosed. The insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch apparatus is installed to the insert pocket, so that the damaged latch apparatus can be easily replaced. The insert has a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes in the lower direction. Thus, the insert can load semiconductor devices regardless of the sizes of the semiconductor devices.