Test Handler Loading Unit for Semiconductor Pitch Adjustment
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Solution Overview
Problem
Conventional test handlers face inefficiencies due to complex and heavy configurations required for adjusting semiconductor device pitches, leading to increased loading time and misalignment issues when transferring devices from user trays to test trays.
Innovation Solution
A test handler with a loading unit featuring moving type loading tables and dual picking apparatuses that adjust and transfer semiconductor devices, allowing for sequential and efficient adjustment of front/rear and right/left pitches between semiconductor devices, reducing the need for additional alignment mechanisms and minimizing weight, thereby enhancing mobility and processing speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a conventional picking apparatus with adjustable pitch mechanisms is used to transfer semiconductor devices from user trays to test trays, then the pitch between semiconductor devices can be adjusted, but the apparatus becomes complex and heavy, reducing mobility and increasing loading time
Solution Approach 1:
The picking apparatus is divided into multiple independent picking units, each capable of picking semiconductor devices from user trays. Each picking unit can be independently controlled and positioned, allowing pitch adjustment without requiring a complex overall structure. This segmentation enables the system to handle different pitch requirements while maintaining simplicity at the component level.
Solution Approach 2:
The picking apparatus employs movable picking units that can dynamically adjust their positions along the tray. Instead of a fixed complex mechanism, the system uses controllable movement of individual picking units to adapt to different pitch requirements. This dynamic adjustment capability maintains versatility while keeping the base structure simple and lightweight.
2Adaptability or versatility
If a conventional picking apparatus with pitch adjustment mechanisms is used, then semiconductor device pitch can be adjusted, but the apparatus weight increases, reducing loading speed
Solution Approach 1:
By segmenting the picking apparatus into multiple lightweight independent units rather than one heavy adjustable mechanism, the system achieves pitch adjustment capability without excessive weight. Each segment can be independently controlled to achieve the required pitch configuration, maintaining fast loading speeds.
Solution Approach 2:
The patent replaces complex mechanical pitch adjustment mechanisms with a control system that positions multiple simple picking units. Instead of mechanically transforming a single apparatus to adjust pitch, the system uses controlled positioning of multiple units, reducing mechanical complexity and weight while maintaining adaptability.
3Productivity
If semiconductor devices are transferred directly from user trays to test trays without intermediate loading tables, then the process is simplified, but pitch adjustment and alignment become difficult
Solution Approach 1:
The loading process is segmented into multiple independent picking operations rather than a single complex transfer operation. Each picking unit independently picks devices from the user tray and places them on the test tray with precise positioning. This segmentation allows direct transfer while maintaining alignment precision through individual unit control.
Solution Approach 2:
The picking apparatus incorporates feedback mechanisms that detect the actual positions of semiconductor devices on both user trays and test trays. Based on this feedback, the control system adjusts the positioning of each picking unit to achieve precise pitch adjustment and alignment during the transfer process, ensuring manufacturing precision without complex mechanical mechanisms.
Data Source
AI summary
When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.