Test Handler Tray Transfer Mechanism for Semiconductor Loading

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Solution Overview

Problem

Conventional test handlers face challenges with increased production costs and resource wastage due to the need for additional components and complex adjustments when handling large-sized test trays, as well as inefficiencies in loading and unloading processes that lead to extended processing times and increased risk of jams.

Innovation Solution

A test handler design where the insert-opening apparatus is modular and integrated with a test tray transfer apparatus, allowing simultaneous opening of multiple inserts as the tray is transferred, reducing the need for multiple opening units and enabling continuous loading without intervals, thus minimizing component count and processing time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple opening units are used to handle large-sized test trays, then all inserts can be opened, but production cost increases and device complexity increases

Engineering Contradiction:
Improvecapability to handle large-sized test traysVSAvoidnumber of opening units
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The test tray is made movable between different positions relative to the single opening unit. The tray can be dynamically repositioned to present different sets of inserts to the opening unit, enabling a single unit to handle all inserts on large-sized trays without requiring multiple static opening units.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The single opening unit is designed to perform multiple functions by opening different inserts at different positions. Through the movable tray mechanism, one opening unit serves the role of multiple opening units would otherwise be needed, achieving multi-functionality with a single component.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If multiple opening units are used to handle large-sized test trays, then all inserts can be opened, but manufacturing cost increases

Engineering Contradiction:
Improvecapability to handle large-sized test traysVSAvoidmanufacturing cost
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The movable tray mechanism allows a single opening unit to access all inserts on large-sized trays by repositioning the tray during the opening process. This dynamic approach eliminates the need to manufacture and install multiple expensive opening units, significantly reducing manufacturing costs while maintaining full functionality.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Instead of creating multiple physical opening units (expensive copies), the system uses one opening unit with the ability to service all positions through tray movement. This single-unit approach avoids the multiplicative cost of manufacturing multiple identical or similar components.

Inventive Principle:
Principle #26Copying

3Adaptability or versatility

If inserts are opened sequentially at different positions, then all inserts can be opened, but loading time increases

Engineering Contradiction:
Improvecapability to open inserts at multiple positionsVSAvoidloading time
Core Design Contradiction:
Adaptability or versatilityVSProductivity

Solution Approach 1:

The loading process is made continuous by coordinating tray movement with the opening and loading operations. While the tray is being repositioned to the next set of inserts, the pick and place apparatus can prepare or begin loading operations, eliminating idle time and maintaining continuous productive action throughout the process.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The tray is repositioned to the next position in advance before the current loading operation is fully complete. This preliminary movement allows the system to prepare for the next set of inserts while current operations are finishing, reducing overall cycle time and preventing idle waiting periods.

Inventive Principle:
Principle #10Preliminary action

4Manufacturing precision

If the pick and place apparatus stops during tray transfer, then positioning can be accurate, but loading efficiency decreases

Engineering Contradiction:
Improvepositioning accuracyVSAvoidloading efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The system maintains continuous operation by coordinating tray transfer with apparatus movement. Both the tray and the pick and place apparatus move simultaneously to their respective positions, eliminating stopping and starting. This coordinated continuous motion maintains positioning accuracy while preventing interruptions that would reduce loading efficiency.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS8026735B2Test handler
Publication Date: 2011.09.27 TECHWING CO LTD
  • US8026735B2 patent drawing
  • US8026735B2 patent drawing
  • US8026735B2 patent drawing

AI summary

A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.