Test Tray Transfer Mechanism for Side-Docking Test Handler
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Solution Overview
Problem
Conventional side-docking type test handlers are limited in processing capacity, as they can only test semiconductor devices loaded on a single test tray at a time, which restricts the number of devices that can be tested simultaneously and hampers processing speed.
Innovation Solution
A method for transferring test trays in a side-docking type test handler, where three test trays are concurrently tested by changing their posture from horizontal to vertical during transfer, allowing them to be arranged and tested in multiple rows within the test chamber, and then returned to horizontal for unloading, thereby increasing the number of devices that can be tested simultaneously.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a single test tray is tested at a time in conventional side-docking type test handlers, then the structure remains simple and easy to operate, but the processing capacity and number of devices that can be tested simultaneously are limited
Solution Approach 1:
The patent changes the test tray from horizontal orientation to vertical orientation, utilizing the vertical dimension to arrange multiple test trays (first, second, and third test trays) in sequence. This dimensional change enables concurrent testing of multiple devices without increasing the horizontal footprint, thereby improving processing capacity while maintaining structural simplicity.
Solution Approach 2:
The test tray is segmented into multiple positions (first test tray position, second test tray position, third test tray position) arranged vertically. Each position can hold a separate test tray, allowing independent testing operations. This segmentation enables parallel processing of multiple devices while maintaining a simple overall structure.
2Productivity
If test trays are transferred horizontally in conventional configurations, then the transfer path is simple, but the number of test trays that can be concurrently tested is limited to one
Solution Approach 1:
The patent utilizes vertical arrangement of test trays to enable concurrent testing. The first test tray is transferred to the first test tray position, the second test tray to the second test tray position, and the third test tray to the third test tray position in vertical sequence. This allows multiple test trays to be processed simultaneously, reducing the overall testing time compared to sequential horizontal transfer.
Solution Approach 2:
The test tray transfer mechanism continuously transfers trays between loading/unloading units and the test chamber without idle time. The vertical arrangement allows continuous testing of multiple trays in sequence, ensuring that the testing process operates at full capacity without unnecessary delays.
3Quantity of substance
If semiconductor devices are densely loaded on customer trays to increase processing amount, then the quantity of devices increases, but the gap between devices does not satisfy test conditions
Solution Approach 1:
The patent segments the testing process into multiple vertical positions, allowing different test trays to be tested concurrently. Each test tray can be optimally configured with semiconductor devices, ensuring adequate spacing for test conditions while maximizing the total number of devices tested through parallel processing.
Solution Approach 2:
By arranging test trays vertically rather than horizontally, the patent creates additional space for device placement while maintaining proper test conditions. The vertical arrangement allows devices to be spaced appropriately on each tray while increasing the overall processing capacity through concurrent testing of multiple trays.
Data Source
AI summary
The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.