Test Head Brake Unit Suppressing Probe Card Bending

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Solution Overview

Problem

In electronic component test apparatuses, large pressing forces applied to probe cards can cause bending due to the transmission of force through the head plate and HIFIX, leading to potential bending of the probe card, especially when the probe card is large or has many pins.

Innovation Solution

A test head with a transmitting device positioned between the probe card and the frame to absorb and distribute the pressing force, utilizing a holding mechanism, limiting means, and lock mechanisms to prevent the probe card from bending, and incorporating brake units and limit units to ensure force transmission directly to the frame.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Force

If the head plate and top plate are coupled together to transmit pressing force, then the pressing force can be transmitted to the frame, but the head plate bends under large pressing force causing the probe card to bend

Engineering Contradiction:

Improvepressing force transmissionVSAvoidhead plate bending

Core Design Contradiction:

ForceVSShape

Solution Approach 1:

A brake unit is introduced as an intermediary component between the top plate and the frame. The brake unit includes a shaft that contacts the top plate and a lock mechanism that transmits pressing force to the frame, preventing direct force transmission through the head plate while maintaining structural support

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The force transmission path is segmented into separate components: the top plate, the brake unit with shaft, and the frame. This segmentation allows the pressing force to be transmitted through the brake unit to the frame without causing the head plate to bend

Inventive Principle:

Principle #1Segmentation

2Productivity

If the probe card is made larger with increased pins to handle more tests, then testing capacity increases, but the pressing force increases significantly causing the probe card to bend

Engineering Contradiction:

Improvetesting capacityVSAvoidprobe card bending resistance

Core Design Contradiction:

ProductivityVSStrength

Solution Approach 1:

The brake unit acts as a mediator that supports the increased pressing force from larger probe cards with more pins. The shaft in the brake unit receives the pressing force and transmits it to the frame, preventing the force from causing probe card bending while maintaining high testing capacity

Inventive Principle:

Principle #24Intermediary (Mediator)

Data Source

PatentUS8890558B2Test head and semiconductor wafer test apparatus comprising same

Publication Date: 2014.11.18 ADVANTEST CORP

AI summary

Providing a test head capable of suppressing a probe card from bending.The test head 40 comprises: a test head main body 51 having a frame 51; an interface apparatus 60 electrically connecting a probe card 20 and the test head main body 50 with each other; and a brake unit 80 positioned between the probe card 20 and the frame 51 to transmit a pressing force F applied to the probe card 20 to the frame 51.