Test Head Data Processing Unit for Automated Testing Efficiency
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional automated testing machines require external computing devices for data processing, leading to increased volume, time, and costs due to the need for signal transmission via cables.
Innovation Solution
Integrating a test processing unit with data processing and storage capabilities directly into the test head of the automated testing machine, allowing for real-time processing and analysis of signals without the need for external devices or cables.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data processing is performed using an external computing device connected via cable, then data processing capability is provided, but equipment volume increases and data processing time is extended
Solution Approach 1:
The patent merges the data processing unit directly into the test head, combining previously separate functions (testing and data processing) into a single integrated component. This eliminates the need for external computing devices and cable connections, enabling real-time data processing at the source and significantly reducing data transmission time.
Solution Approach 2:
The patent introduces an intermediary data processing unit within the test head that acts as a local mediator between the testing components and the external system. This intermediary processes data locally before any external transmission is needed, eliminating the bottleneck of external processing and reducing overall data processing time.
2Productivity
If data processing is performed using an external computing device, then data processing capability is provided, but equipment volume increases
Solution Approach 1:
The patent merges the data processing unit directly into the test head, combining previously separate functions (testing and data processing) into a single integrated component. This eliminates the need for external computing devices and cable connections, enabling real-time data processing at the source and significantly reducing data transmission time.
3Ease of operation
If cable connection to external computing device is used, then data processing capability is provided, but system complexity and costs increase
Solution Approach 1:
The patent extracts the data processing function from the external computing device and relocates it directly into the test head. This eliminates the need for cable connections and external computing devices, simplifying the overall system architecture and reducing operational complexity while maintaining full data processing capability.
Data Source
AI summary
An automated testing machine with data processing function and an information processing method thereof are introduced. The automated testing machine includes a test head for testing more than one device under testing (DUT), and the test head further includes a test processing unit for providing more than one electrical test signal to the DUTs and conducting a processing and analyzing on more than one electrical feedback data fed back from the DUTs, so as to generate analysis result information. With the test processing unit capable of conducting data processing directly provided in the test head, signals obtained from the DUTs can be directly analyzed and processed to enable increased data processing efficiency, increased convenience in use and reduced costs of the automated test machine and the information processing method thereof.