Programmable Test Instrument Multi-Tier API Translation

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Solution Overview

Problem

Current automatic test equipment (ATE) systems lack an efficient mechanism to seamlessly integrate and execute test programs across different processing layers with distinct application programming interfaces (APIs), leading to inefficiencies in device testing and increased development costs due to differing skill sets and tool maturity across tiers.

Innovation Solution

A multi-tiered test instrument architecture with distinct processing layers, each with its own API, where the first layer generates and alters test programs to be compatible with the second layer's API, allowing for seamless execution and reducing latency and timing variability by utilizing programmable logic and embedded processing devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a multi-tiered architecture with distinct APIs is used, then device testing performance and accuracy are improved, but system complexity and integration difficulty increase

Engineering Contradiction:
Improvedevice testing accuracyVSAvoidsystem integration complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces an intermediary translation layer that converts test programs from the first API (system control layer) to the second API (device testing layer). This mediator handles the complexity of API compatibility and translation, allowing the multi-tiered architecture to achieve high testing precision without requiring direct integration between disparate systems. The intermediary absorbs the integration complexity while preserving the benefits of layered architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If test programs are developed on the first processing system, then development ease and tool accessibility are improved, but execution latency and timing variability increase

Engineering Contradiction:
Improvetest program development easeVSAvoidtest execution latency
Core Design Contradiction:
Ease of operationVSLoss of time

Solution Approach 1:

The patent segments the test system into two distinct functional layers: a first processing system optimized for program development and control, and a second processing system optimized for high-speed test execution. By separating development functions from execution functions, developers can use familiar tools on the first system while the second system handles time-critical operations with minimal latency. The segmentation allows each layer to be optimized for its specific purpose without compromising the other.

Inventive Principle:
Principle #1Segmentation

3Adaptability or versatility

If different APIs are used for control and testing functions, then functional specialization and performance are improved, but compatibility and ease of integration worsen

Engineering Contradiction:
Improvefunctional specializationVSAvoidintegration ease
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The patent implements a universal translation mechanism that enables test programs written for one API to execute on systems with different APIs. The translation layer provides multi-functionality by supporting multiple API standards and protocols, allowing the system to maintain functional specialization through distinct APIs while achieving integration ease through automatic program translation. This universal approach eliminates the need for separate development tools for each API layer.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10776233B2Programmable test instrument
Publication Date: 2020.09.15 TERADYNE INC
  • US10776233B2 patent drawing
  • US10776233B2 patent drawing
  • US10776233B2 patent drawing

AI summary

In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.