Test Instrument Bit-Error Detection via Pattern Matching
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Solution Overview
Problem
Existing test and measurement instruments face challenges in accurately detecting bit errors in digitized data, which can be masked within error-free data, hindering effective analysis and acquisition.
Innovation Solution
A test and measurement instrument comprising an input to receive and digitize signals, a memory to store reference digitized data, a pattern detector to generate synchronization signals, and a comparator to compare the reference data with the digitized data, enabling detection and analysis of bit errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If digitized data is displayed without error detection, then the display is simple and continuous, but bit errors cannot be identified and are masked within error-free data
Solution Approach 1:
The patent segments the digitized data into individual bits or groups of bits for separate analysis. The comparator divides the data stream into reference portions and received portions, enabling bit-by-bit error detection without overwhelming the system with entire data blocks at once.
Solution Approach 2:
The patent introduces a comparator as an intermediary component between the data input and display systems. This comparator acts as a mediator that compares received digitized data against reference data, identifying errors without requiring fundamental changes to the existing display architecture.
2Measurement precision
If bit-by-bit comparison is performed to detect errors, then error detection precision is improved, but the processing time and complexity increase
Solution Approach 1:
The patent stores reference digitized data in advance in a memory component before comparison is needed. This preliminary preparation of reference data eliminates the need to generate or retrieve reference data during the comparison process, significantly reducing processing time.
Solution Approach 2:
The patent creates a copy of the reference data and stores it in memory for rapid access during comparison. This copying approach allows the comparator to quickly retrieve reference portions without accessing the original source, enabling faster real-time error detection.
3Reliability
If reference data is stored and compared with incoming data, then bit error detection capability is enhanced, but memory requirements and device complexity increase
Solution Approach 1:
The patent applies local quality by storing and comparing only the specific reference portions of data that are necessary for error detection, rather than storing entire data sets. The comparator focuses on specific bits or groups of bits that contain error information, reducing overall memory requirements.
Solution Approach 2:
The patent changes the parameter of data representation by storing reference data in a formatted structure that optimizes for comparison operations. The memory stores data in a manner that allows rapid retrieval of specific portions, and the comparator processes data in optimized segments rather than raw form.
Data Source
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AI summary
A test and measurement instrument including an input configured to receive a signal and output digitized data; a memory configured to store reference digitized data including a reference sequence; a pattern detector configured to detect the reference sequence in the digitized data and generate a synchronization signal in response; a memory controller configured to cause the memory to output the reference digitized data in response to the synchronization signal; and a comparator configured to compare the reference digitized data output from the memory to the digitized data.