Test Item Aggregation for Embedded System Simulation Efficiency
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Solution Overview
Problem
The complexity of modern embedded systems, particularly in automobiles, leads to increased development times due to the need for extensive performance evaluations and verification, which are hindered by the large number of test items required, even when test items share common input data ranges.
Innovation Solution
A computer system that aggregates test items by identifying independent events and combining common events into a single aggregate test item, while avoiding overlaps, to reduce the number of tests needed during simulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If test items are consolidated based on common input data ranges, then the number of test steps is reduced, but the test time is not significantly reduced because test items with different input data ranges cannot be integrated
Solution Approach 1:
The invention segments test items into independent event groups that can be executed in parallel. By analyzing event independence and grouping non-dependent events together, the system divides the test execution into multiple concurrent segments, significantly reducing overall test time while maintaining thorough coverage of all test conditions
Solution Approach 2:
The invention introduces a new dimension for test item integration by using event independence analysis rather than relying solely on input data range matching. This allows test items with different input data ranges to be integrated if their events are independent, expanding the scope of consolidatable tests beyond traditional methods
2Measurement precision
If the number of test items is increased to cover all abnormal states in complex systems, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The invention segments the large set of test items into multiple smaller groups based on event independence. Each group contains events that can be executed together without interference, making the overall test suite more manageable while maintaining comprehensive coverage of abnormal states through parallel execution of these segmented groups
Solution Approach 2:
The invention merges multiple test items into integrated test sequences by combining events from different original test items that are determined to be independent. This consolidation reduces the apparent number of separate test operations while preserving the ability to detect all abnormal states through the combined event coverage
Data Source
AI summary
A processor acquires a plurality of test items for a simulation model of a target system, each test item including at least one event; detects a set of test items from the plurality of test items under an aggregation condition in which an event in the set is not dependent on an event in another test item in the set; includes a common event, which is an event in the set that is the same as an event in another test item in the set, in an aggregate test item while avoiding overlapping of the common event, and includes a unique event, which is an event in the set that differs from events in other test items in the set, in the aggregate test item; and executes a simulation using the simulation model in accordance with the aggregate test item.