Test Module Parallel Processing Reduces Testing Time
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Solution Overview
Problem
Existing test apparatuses face increased testing time when performing multiple test items in series due to sequential operation of test modules and sections, leading to inefficiencies in result processing and test execution.
Innovation Solution
A test apparatus and module design that allows for overlapping processing by using multiple memory banks to store and transmit test results concurrently, enabling simultaneous execution of subsequent tests during result processing time, thereby reducing overall testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test modules operate in series for multiple test items, then test reliability is maintained through sequential processing, but testing time increases significantly
Solution Approach 1:
The test module is segmented into multiple independent testing sections (analog testing section, digital testing section, etc.), each capable of performing different test items simultaneously. This segmentation allows the test module to process multiple test items in parallel rather than sequentially, reducing overall testing time while maintaining reliability through independent verification in each section.
Solution Approach 2:
The patent transitions from one-dimensional sequential processing to multi-dimensional parallel processing by introducing multiple testing sections that operate simultaneously. The control apparatus coordinates these sections across different dimensions (analog, digital, mixed signal), enabling concurrent execution of multiple test items without compromising the systematic approach needed for reliable testing.
2Measurement precision
If the control apparatus waits for complete result processing before starting the next test, then data accuracy is ensured through full computation, but testing efficiency decreases
Solution Approach 1:
The control apparatus performs preliminary actions by pre-loading test programs into the test module before actual testing begins. Additionally, while one test's results are being processed, the control apparatus has already prepared and queued the next test program, enabling seamless transition between tests without waiting for complete result processing, thus improving efficiency while maintaining data accuracy through pre-validated test sequences.
Solution Approach 2:
The system maintains continuity of useful action by ensuring that while the control apparatus is processing results from one test, the test module is already executing or preparing the next test. This continuous operation eliminates idle waiting time and keeps both the control apparatus and test module productively engaged throughout the testing process, thereby improving efficiency without sacrificing data accuracy.
3Productivity
If multiple testing sections are used simultaneously, then testing throughput increases through parallel processing, but system complexity increases
Solution Approach 1:
The test module is designed with universal, multi-functional testing sections that can handle multiple types of tests (analog, digital, mixed signal) using standardized interfaces and control mechanisms. This multi-functionality allows the system to achieve high throughput through parallel processing while avoiding the complexity that would arise from having dedicated specialized sections for each test type, as the same hardware resources can be dynamically allocated to different test functions.
Solution Approach 2:
The system manages complexity by dynamically changing operational parameters (such as which testing section is active, what test program is executed, what data format is used) rather than creating physically different hardware for each test type. This parameter-based control allows flexible parallel processing of multiple test items while maintaining a relatively simple, unified hardware architecture that can be programmatically reconfigured for different testing scenarios.
Data Source
AI summary
A test apparatus that tests a device under test, comprising a control apparatus sequentially executing a plurality of test programs and controlling testing of the device under test; and a test module controlled by the control apparatus to test the device under test by communicating with the device under test and to transmit a test result of each test program to the control apparatus. The test module includes memories that store the test results of the test programs, and starts a subsequent test such that at least a portion of a result processing time period of a current test, from when a test result stored in a first memory begins being transmitted to the control apparatus to when processing of the test result by the control apparatus ends, overlaps with at least a portion of a test execution period in which the subsequent test is executed using a second memory.