Test Pads for Fingerprint Sensor Qualification

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Solution Overview

Problem

Current electronic devices integrating fingerprint identification and display functions face challenges in efficiently testing and qualifying the sensing units, leading to potential unqualified products and reduced overall qualification rates.

Innovation Solution

The electronic device incorporates a substrate with first pads and test pads electrically connected to sensing units, allowing for the transmission of test signals to check the functionality of the sensing units, which can be done after fabrication or after substrates are adhered and liquid crystal is filled, thereby improving the qualification process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If sensing units are integrated into the electronic device without dedicated test pads, then device complexity is reduced, but manufacturing precision and qualification rate deteriorate due to inability to effectively test sensing unit functionality

Engineering Contradiction:
Improvestructure complexityVSAvoidqualification rate
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The patent divides the testing function from the main device structure by adding separate test pads that are electrically connected to sensing units through signal lines. This segmentation allows independent testing of sensing units without affecting the overall device structure, enabling effective quality control while maintaining device simplicity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces test pads as intermediary elements between the external testing equipment and the sensing units. These test pads serve as mediators that enable signal transmission for testing purposes without requiring direct access to the sensing units, thus facilitating quality control while preserving the integrated device architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If testing is performed after final assembly, then device complexity is minimized, but reliability deteriorates due to inability to detect unqualified sensing units early in the manufacturing process

Engineering Contradiction:
Improvetesting process complexityVSAvoidproduct qualification
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent implements preliminary testing capability by providing test pads that allow sensing units to be tested at various stages of the manufacturing process, including after substrate fabrication and before final assembly. This preliminary action enables early detection of defective sensing units, ensuring higher product reliability while maintaining simple device architecture.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20230215771A1Electronic device
Publication Date: 2023.07.06 INNOLUX CORP
  • US20230215771A1 patent drawing
  • US20230215771A1 patent drawing
  • US20230215771A1 patent drawing

AI summary

An electronic device includes a substrate, a plurality of first pads, a plurality of sensing units and a plurality of test pads. The first pads are disposed on the substrate, the sensing units are disposed on the substrate and electrically connected to the first pads, and the test pads are disposed on the substrate and electrically connected to the sensing units.