Test Pattern Analysis for Conveying Error Detection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional test pattern formation methods in image forming systems are inefficient in quickly forming test patterns and accurately determining control errors, particularly conveying errors in sheet handling, which hinders the improvement of image quality.

Innovation Solution

An electronic device with an image acquiring device and a controller that analyzes an image containing a test pattern with intersecting first and second patterns, where the controller calculates the widths of overlapping images and detects intersecting positions based on brightness distribution, using a model pattern to compensate for errors and improve detection accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional test pattern formation methods are used, then test patterns can be formed, but it is difficult to form them quickly and determine control errors at high accuracy

Engineering Contradiction:
Improvecontrol error determination accuracyVSAvoidtest pattern formation speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The test pattern is divided into multiple sets, each containing a first pattern and a second pattern with different orientations. This segmentation allows parallel processing of multiple measurement regions, improving both formation speed and measurement accuracy through statistical analysis of multiple samples

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces angular orientation as an additional dimension by forming patterns at different angles (e.g., 0 degrees and 45 degrees). This dimensional change enables more robust error determination by analyzing pattern intersections from multiple orientations, improving accuracy without requiring slower minute conveyance

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If minute sheet conveyance is used to form test patterns, then conveying error can be determined accurately, but test pattern formation becomes time-consuming

Engineering Contradiction:
Improveconveying error determination accuracyVSAvoidtest pattern formation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Instead of using minute physical conveyance to create measurement patterns, the patent uses the recording head to directly form multiple sets of patterns at different positions and orientations on the sheet. This copying approach eliminates the need for repeated minute conveyance operations while maintaining measurement accuracy

Inventive Principle:
Principle #26Copying

Solution Approach 2:

Multiple patterns are pre-formed on the sheet in different orientations and positions before analysis. This preliminary action allows the conveying error to be determined through image analysis of the pre-formed patterns rather than through time-consuming iterative conveyance and measurement

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10668758B2Electronic device using test pattern, method of analyzing test pattern, and non-transitory recording medium storing instructions to analyze test pattern
Publication Date: 2020.06.02 BROTHER KOGYO KK
  • US10668758B2 patent drawing
  • US10668758B2 patent drawing
  • US10668758B2 patent drawing

AI summary

An electronic device is configured to acquire image data containing a test pattern including first and second patterns intersecting with each other. Pixels corresponding to the test pattern are determined by comparing brightness of each pixel with a threshold value, and widths of an overlapped image of the first and second patterns in an orthogonal direction at a plurality of different positions in the reference direction are calculated. Intersecting positions of the first pattern and the second pattern in the test pattern is detected based on a distribution of widths at the plurality of different positions. The test pattern has a model pattern having a set width in the orthogonal direction separate from the first and second patterns. The pixels corresponding to the test pattern are determined based on a threshold value, and widths at the plurality of positions of the overlapped image in the reference direction are calculated.