Test Platform With Independent Fault Inserters
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Solution Overview
Problem
Existing data storage system testing methods are inefficient and costly due to the need for developing and maintaining separate fault-specific test variants, which divert resources away from 'sunny day' testing and result in duplicated logic and reduced fault scenario coverage.
Innovation Solution
A method that uses independent fault inserters to test the response of normal functionality to fault conditions concurrently with normal-functional tests, allowing for flexible and efficient testing across various fault scenarios without requiring fault-specific test variants, by employing a global framework for fault insertion that can be reused across different test cases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate fault-specific test variants are developed and maintained, then fault scenario coverage is improved, but device complexity and resource overhead increase
Solution Approach 1:
The test system is segmented into independent components: normal-functional tests that verify expected behavior, and separate fault inserters that independently introduce specific fault conditions. This segmentation allows each component to be developed and maintained separately, reducing overall test complexity while maintaining comprehensive fault scenario coverage.
Solution Approach 2:
The fault inserter is designed as a universal component that can be applied across multiple normal-functional tests. Instead of creating dedicated fault-specific test variants for each test case, a single fault inserter mechanism can introduce various fault conditions into any normal-functional test, reducing duplication and resource overhead while improving fault scenario coverage.
2Reliability
If separate fault-specific test variants are developed and maintained, then fault scenario coverage is improved, but loss of time and resources increase
Solution Approach 1:
The fault inserter serves as a universal tool that can be applied to multiple normal-functional tests across different fault scenarios. This eliminates the need to develop and maintain separate fault-specific test variants for each test case, significantly reducing the time and resources required for test development and maintenance while maintaining comprehensive fault scenario coverage.
Solution Approach 2:
Instead of creating unique fault-specific test variants for each scenario, the system uses a standardized fault inserter mechanism that can be copied and applied across different test cases. This template-based approach reduces duplication of effort and accelerates test development while ensuring consistent fault scenario coverage.
3Productivity
If normal-functional tests are executed concurrently with fault inserters, then testing efficiency is improved, but measurement precision of fault response may be reduced
Solution Approach 1:
The system introduces an intermediary fault handler that mediates between the fault inserter and the normal-functional test. This handler precisely captures and records fault conditions and system responses, ensuring accurate measurement of fault responses even when executed concurrently with normal-functional tests. The intermediary maintains measurement precision while enabling concurrent execution for improved testing efficiency.
Data Source
AI summary
A method of testing a data storage system includes maintaining libraries of test routines, a first library including a set of normal-functional tests each operable to test corresponding normal functionality of the data storage system, a second library including a set of fault inserters each being independently operable to induce a corresponding fault condition into the data storage system. Normal-functional tests are executed concurrently with one or more of the fault inserters to cause the normal-functional tests to encounter the corresponding fault conditions during execution and thereby test a response of the normal functionality of the data storage system to the occurrence of the fault conditions.