High-Frequency Test Probe Centering Mechanism for Alignment Tolerance
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Solution Overview
Problem
High-frequency test pin devices face challenges in achieving precise alignment with test contact partners, particularly with rectangular shapes, while also needing to accommodate positional and dimensional deviations, and require easy maintenance due to wear issues, which often leads to the entire device needing replacement.
Innovation Solution
The design allows for two relative positions between the inner and outer housings, enabling tilting and rotating movements within predetermined angular limits to adapt to dimensional errors, combined with a centering section and guide cutout for secure alignment and flexible movement, ensuring high contact reliability and ease of maintenance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the test pin device is designed with fixed alignment for rectangular contact partners, then precise alignment is achieved, but the device cannot accommodate positional and dimensional deviations
Solution Approach 1:
The patent applies the dynamics principle by enabling the inner housing to rotate and tilt relative to the outer housing through a guide cutout mechanism. This dynamic capability allows the device to adapt to positional and dimensional deviations of rectangular contact partners while maintaining precise alignment during engagement, resolving the contradiction between fixed alignment precision and adaptability to variations.
2Reliability
If the contact section is made rigid for high-frequency signal integrity, then contact quality is improved, but the device cannot accommodate wear and positional errors
Solution Approach 1:
The patent implements dynamics by allowing the inner housing containing the contact section to rotate and tilt relative to the outer housing. This dynamic movement capability enables the rigid contact section to maintain high-frequency signal integrity while accommodating wear and positional errors through controlled angular adjustments during engagement.
Solution Approach 2:
The patent applies parameter changes by modifying the angular orientation parameters of the inner housing relative to the outer housing. The guide cutout enables changes in rotation angle and tilt angle, allowing the contact section to adjust its parameters to compensate for wear and dimensional errors while maintaining contact quality.
3Reliability
If the entire device is replaced when contact elements wear, then reliability is maintained, but maintenance complexity and cost increase
Solution Approach 1:
The patent applies segmentation by dividing the device into separable components: an outer housing and an inner housing containing the contact section. This segmentation allows the inner housing with worn contact elements to be replaced independently while retaining the outer housing, significantly improving ease of repair and reducing maintenance costs compared to replacing the entire device.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution provides precise, flexible, and tolerant contact connections, enhancing performance for high-load cycles by allowing three-dimensional movement and maintaining contact quality despite positional deviations, while enabling easy replacement of worn parts.
Implementation Method 1
resiliently guided against the restoring force of an energy accumulator
Implementation Method 2
the contact-making elements used wear or are subject to wear in some other way
Data Source
Figure 1~11
Figure 4~9
AI summary
The invention relates to a high-frequency test probe device comprising a contact section (18) which forms an inner contact (40) and an outer contact (44), which is designed to interact with a contact partner (30) that is to be contacted for testing purposes, and which is provided on an inner housing (16) at one end and can be contacted at a pickup end (20) for signal pickup at the other end. The inner housing is guided at least along some sections in an outer housing (10) and in an axially movable manner relative to same.