Test Probe Current Path Segmentation for Thermal Management
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Solution Overview
Problem
Existing standard test probes for high power and high current power modules face challenges with limited lifespan due to high resistance and heat generation, which restricts their usage to lower current levels and results in reduced mating/un-mating cycles, and inadequate thermal dissipation.
Innovation Solution
An electrical test probe design featuring a test prod with a larger cross-sectional area than the elastic element, allowing most current to pass through the test prod directly, reducing heat generation and incorporating a heat sink for improved thermal dissipation, along with a power module testing system that includes a test platform and testing equipment for efficient connection and movement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the test probe uses a spring as the elastic element for contact, then the contact flexibility is improved, but the resistance increases and heat generation worsens
Solution Approach 1:
The patent introduces a low-resistance conductive layer as an intermediary between the spring and the contact terminal. This conductive layer acts as a mediator that provides a preferred current path with lower resistance, while the spring maintains its mechanical function for contact flexibility. The conductive layer has much smaller resistance than the spring, so most current flows through it rather than the spring, reducing heat generation in the elastic element.
2Power
If the current passes through the spring for high current testing, then the testing capability is improved, but the spring temperature increases and lifespan reduces
Solution Approach 1:
The patent segments the current path from the mechanical contact path. The spring is separated into purely mechanical function (providing contact pressure and flexibility), while the electrical current path is separated into the conductive layer which has optimized electrical properties. This segmentation allows the spring to handle mechanical stresses without bearing the thermal burden of high current passage, thereby extending its lifespan.
3Ease of manufacture
If the test probe structure is simplified, then the manufacturing cost is reduced, but the thermal dissipation capability worsens
Solution Approach 1:
The patent merges the electrical contact function and thermal management function into the same conductive layer. The conductive layer that provides low-resistance current path also serves as a thermal conduction path, efficiently conducting heat away from the contact interface. This merging of functions achieves improved thermal dissipation without adding separate complex thermal management components, maintaining manufacturing simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution extends the lifespan of the test probe by minimizing heat generation and improving thermal dissipation, enabling the testing of high power modules with higher current and voltage outputs while maintaining a longer cycle life and efficient heat management.
Implementation Method 1
The tube and the test prod can have a relative movement within an elastic range of the elastic element
Implementation Method 2
The test prod has a first terminal provided to form a contact with a power module to be tested and a second terminal provided to be connected with a testing equipment
Implementation Method 3
incorporating a heat sink for improved thermal dissipation
Data Source
Figure 1~2b
Figure 3a~4
Figure 5
AI summary
An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a second terminal (212) provided to be connected with a testing equipment. The test prod (210) also has a first stopper (213) between the first terminal (211) and the second terminal (212). The tube (220) has an internally extending stopper (221). The tube (220) is mounted around the test prod (210) in a longitudinal direction of the test prod (210). The elastic element (230) is accommodated between the first stopper (213) of the test prod (210) and the internally extending stopper (221) of the tube (220). The tube (220) and the test prod (210) can have a relative movement within an elastic range of the elastic element (230). The area of a cross section of the test prod (210) is much larger than the area of the cross section of the elastic element (230). A power module testing system (600) which comprises at least one electrical test probe (200) is also presented.