Multi-Contact Test Probe Guide Geometry to Limit Twist and Wear
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Solution Overview
Problem
Existing test probe devices suffer from high error rates and wear due to unnecessary twisting during contact-making processes, which can lead to jamming and require complex assembly, especially when multiple contact elements are involved.
Innovation Solution
A test probe device with a guide portion and guide opening having specific cross sections to limit the maximum rotational and tilting angle of the test probe relative to the carrier part, featuring a transfer portion with a circular cross section and lead-in slope to ensure consistent twistability and reduce wobbling, along with a spring element and axial stop to maintain a constant maximum angle of rotation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the guide opening and guide portion have different cross sections to allow larger rotation angles during contact-making, then the adaptability to compensate positioning inaccuracies is improved, but the test probe twists unnecessarily far in the rebounded state causing increased wear and potential jamming
Solution Approach 1:
The patent applies dynamics by making the guide opening cross-section variable along the longitudinal axis. The guide opening has a first cross-section in the contact-making region that allows larger rotation angles for compensation, and a second cross-section in the rebounded state region that limits rotation angles to prevent unnecessary twisting. This dynamic geometric variation resolves the contradiction between adaptability during contact and reliability during rebound.
2Ease of operation
If the guide opening has a larger cross section to allow free movement and tumble, then the ease of operation for contact-making is improved, but the lateral play and wobbling in the rebounded state increases
Solution Approach 1:
The patent applies local quality by differentiating the guide opening cross-section into different regions with different properties. The first region (contact-making region) has a larger cross-section to enable tumble movement and compensate positioning errors, while the second region (rebounded state region) has a smaller cross-section to reduce lateral play and stabilize the test probe in its initial position.
3Stability of the object's composition
If the guide portion cross section is reduced to minimize lateral play, then the stability in rebounded state is improved, but the ability to compensate positioning inaccuracies through tumble movement is reduced
Solution Approach 1:
The patent resolves this contradiction through dynamic geometric design where the guide opening cross-section varies longitudinally. The guide opening provides a larger cross-sectional area in the contact-making region to enable sufficient tumble movement for compensation, while providing a smaller cross-sectional area in the rebounded state region to minimize lateral play and stabilize the test probe.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device ensures low error rates and reduced wear by maintaining a consistent maximum angle of rotation and twistability, allowing for precise contact-making and easy assembly, while optimizing installation space and operational safety.
Implementation Method 1
a spring element is pretensioned between the contact portion and the carrier part
Implementation Method 2
The transfer portion has a lead-in slope in at least one region projecting beyond the guide portion
Data Source
AI summary
The invention relates to a test probe device for making electrical contact with an in particular multi-pole contact partner, with a carrier part, which has at least one guide opening, and with at least one test probe, which is longitudinally displaceably mounted in the guide opening, wherein the test probe has a cylindrical housing in which one or more in particular pin-shaped contact elements are arranged, each of which have a contact end for making contact with the contact partner, wherein the housing has a guide portion longitudinally displaceably mounted in the guide opening and a contact portion spaced apart therefrom, and wherein the contact ends are assigned to the contact portion, wherein a spring element is pretensioned between the contact portion and the carrier part and, adjoining the guide portion at the housing, on the side of the carrier part facing away from the spring element, an axial stop is formed, which interacts with the carrier part against the spring force of the spring element, wherein a maximum rotational and/or tilting angle of the test probe is limited relative to the carrier part by the guide opening and the guide portion, for the purpose of which the guide opening and the guide portion in each case have a cross section with at least one straight line, in particular in each case a polygonal cross section, and wherein guide portion and guide opening are formed in such a way that the test probe can tumble in at least one sliding position relative to the carrier part. It is provided that a transfer portion is formed between the guide portion and the axial stop, that the transfer portion has a circular cross section, the diameter of which is at most as large as the smallest diagonal of the cross section of the guide opening on the one hand and smaller than the largest diagonal and larger than the smallest diagonal of the cross section of the guide portion on the other hand, so that the transfer portion, when viewed over its circumference, radially projects beyond the guide portion only in some regions.