High Frequency Test Probe Lateral Contact Scratch Prevention
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Solution Overview
Problem
High-frequency test pin devices often cause scratches on contact elements during lateral contacting, which is undesirable and can reduce the quality of contact when used as intended, especially when contacting a socket with side-wall arranged contact elements.
Innovation Solution
A high-frequency test pin device with a sleeve-like housing and a contact device featuring test contact elements that contact a second area adjacent to the first contact area, allowing lateral contact without scratching the first area, using a piston and spring mechanism to ensure the test contact element only engages the second area during contact, preventing damage to the first contact area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If test contact elements contact contact elements laterally during insertion, then testing functionality is enabled, but scratching of contact elements occurs
Solution Approach 1:
The contact element is divided into two distinct regions: a first contact region that remains scratch-free and a second contact region that accepts test contact. This segmentation allows the harmful testing action to be localized to a specific area while preserving the integrity of the primary contact surface.
Solution Approach 2:
Different regions of the contact element are given different functional qualities - the first contact region is designed for reliable signal transmission with scratch-free surfaces, while the second contact region is specifically designed to accommodate test contact elements and accept scratches without affecting overall functionality.
2Ease of operation
If test pin device is inserted along longitudinal direction, then bringing together with contact partner is achieved, but increased scratch marks occur on laterally arranged contact elements
Solution Approach 1:
The contact element is pre-designed with a distinguished second contact region that is intended and prepared for test contact operations. This preliminary arrangement ensures that when testing occurs, scratches are confined to the predetermined second region rather than appearing on the primary first contact region.
3Reliability
If first contact region is protected from scratches, then contact quality is maintained, but test contact capability is reduced
Solution Approach 1:
The contact element is divided into two distinct regions: a first contact region that remains scratch-free and a second contact region that accepts test contact. This segmentation allows the harmful testing action to be localized to a specific area while preserving the integrity of the primary contact surface.
Solution Approach 2:
The contact element serves multiple functions through its two-region design: the first contact region provides reliable signal transmission for normal operation, while the second contact region enables testing functionality. This multi-functionality ensures both operational reliability and test capability are maintained simultaneously.
Data Source
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Figure 10~11
AI summary
The invention relates to a high-frequency test pin device (10) and a method for releasably contacting a contact partner, comprising a housing device that is at least partially sleeve-like and a contact device (12) arranged partially in the housing device, wherein the test pin device is designed for joining with the contact partner along a longitudinal extension direction of the test pin device, wherein the contact device has at least one test contact element (28) which is designed for electrically contacting a contact element of the contact partner laterally to the longitudinal extension direction, wherein the contact device is designed such thatthat, by means of the test contact element, a second contact area of the contact element, arranged adjacent to a first contact area of the contact element when viewed in the longitudinal direction, can be contacted laterally to the longitudinal direction by means of the first contact area overlapping the first contact area in the longitudinal direction.