Test Probe Assembly With Spring Latch Retention
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Solution Overview
Problem
Conventional spring-loaded contact probes are expensive to manufacture due to costly machining operations and have a short lifespan, leading to frequent replacements, especially when used for high-frequency testing of integrated circuits where impedance matching is crucial.
Innovation Solution
A test probe assembly with a coil spring-based compliant electrical probe design, featuring elongate plungers with spring latches that engage the spring, allowing for improved biasing and retention, and enabling easier assembly with reduced tolerance requirements, thus reducing manufacturing costs and enhancing durability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional spring-loaded contact probes are manufactured using traditional machining operations, then manufacturing precision and reliability are improved, but manufacturing cost increases and productivity decreases
Solution Approach 1:
The invention changes the manufacturing parameters by transitioning from traditional precision machining to stamping processes. The probe components are manufactured using stamping with appropriate material selection and design modifications, maintaining electrical conductivity and mechanical properties while significantly reducing manufacturing cost and complexity
Solution Approach 2:
The invention adopts a cost-effective approach by using stamped components that are simpler and cheaper to manufacture, accepting that these components may have reduced lifespan compared to machined components, thereby reducing overall manufacturing cost while maintaining adequate functionality
2Manufacturing precision
If external spring probes are designed with shorter length to avoid signal attenuation, then high-frequency testing performance is improved, but manufacturing complexity increases due to costly machining operations
Solution Approach 1:
The invention segments the probe into two separate contact components (first contact component and second contact component) that can be manufactured independently using simpler stamping processes, then assembled together. This segmentation allows each component to be optimized for its specific function while reducing overall manufacturing complexity
Solution Approach 2:
The invention introduces a flange dimension to the contact components, creating a multi-dimensional structure that provides both electrical contact and mechanical retention. The flange extends perpendicular to the contact surface, enabling retention through engagement with corresponding features in the socket, thereby achieving complex functionality through dimensional expansion
3Ease of manufacture
If probe components are designed with flat surfaces for stamping production, then manufacturing cost decreases, but component lifespan reduces due to quick wear
Solution Approach 1:
The invention uses composite construction by combining stamped metal components with appropriate plating or coating layers. The base material provides structural integrity while surface treatments enhance wear resistance and electrical conductivity, extending component lifespan without significantly increasing manufacturing cost
Solution Approach 2:
The invention incorporates curved or rounded contact surfaces on the stamped components rather than purely flat surfaces. The curved contact points distribute wear more evenly and maintain better electrical contact over time, extending component lifespan while remaining compatible with stamping manufacturing processes
4Reliability
If traditional probe designs are used with minimal spacing in test sockets, then impedance matching is maintained, but signal attenuation increases due to long electrical interconnect length
Solution Approach 1:
The invention inverts the traditional probe design by using two separate contact components that contact the socket from opposite sides, with the spring element positioned between them. This inverted arrangement allows the electrical interconnect path to be minimized while maintaining mechanical retention and electrical contact, thereby reducing signal attenuation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design enhances the lifespan and reliability of the test probes by providing stable electrical contact and reduced manufacturing expenses through simpler assembly and lower machining costs, while maintaining effective impedance matching for high-frequency testing.
Implementation Method 1
a spring for biasing the travel of the plunger in the barrel
Implementation Method 2
The plunger bearing slidably engages the inner surface of the barrel
Data Source
AI summary
A test probe assembly includes a first elongate electrically conductive plunger that extends from a proximal first plunger end to a distal first plunger end, and is defined in part by a central longitudinal axis. The first plunger has a first spring latch at the distal first plunger end. At least a portion of the first plunger has an arc with a first plunger outer contact point opposite the first spring latch relative to the longitudinal axis. The first plunger is disposed in a spring. The first plunger outer contact point in contact with the inner diameter of the spring, and the first spring latch engages at least a portion of the spring. A method includes disposing a first plunger within a spring along a spring longitudinal axis, disposing a second probe within the spring along the spring longitudinal axis, and engaging the spring latch and the second plunger spring latch with the spring, for instance by capturing an end coil of the spring with the spring latch of at least one of the spring latch or the second plunger spring latch.