Test Socket Hinge and Spring Mechanism for SSD Terminal Protection
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Solution Overview
Problem
During the manufacturing of solid state drives (SSDs), iterative test processes can cause damage to the via hole inspection terminals due to contact defects and potential short circuits when pins are inserted, leading to impact and force on the electronic device.
Innovation Solution
A test socket design featuring a first body with a fixing portion, a second body that rotates relative to the first body about a hinge pin, a test board with interface pins that include a contact pin and a spring, and an elastic body providing a restoring force to ensure contact with test terminals while absorbing shock and preventing short circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a pin is inserted into a via hole inspection terminal to perform a test, then the test can be conducted, but damage to the via hole inspection terminal and contact defects may occur
Solution Approach 1:
The patent introduces an intermediary structure (the test socket with elastic body and contact pin assembly) between the testing device and the via hole inspection terminal. This intermediary absorbs mechanical stress and prevents direct damage to the terminal while ensuring reliable electrical contact during testing.
Solution Approach 2:
The elastic body is pre-installed in the test socket to provide cushioning before contact occurs. When the contact pin approaches the via hole inspection terminal, the elastic body compresses to absorb impact forces, preventing damage beforehand rather than reacting after damage occurs.
2Productivity
If a plurality of pins are inserted into a plurality of via holes simultaneously, then testing can be performed, but short circuits may occur applying impact or force on the electronic device
Solution Approach 1:
The test socket employs a dynamic structure where the second body can rotate relative to the first body about a hinge pin, and the contact pins are spring-loaded. This dynamic design allows the pins to flex and adjust during insertion, preventing simultaneous rigid contact that causes short circuits and impact forces while maintaining testing efficiency.
Solution Approach 2:
The elastic body changes its physical state (compression) during the testing process. As pins are inserted, the elastic body compresses to absorb impact forces, dynamically adjusting the mechanical parameters of the system to prevent short circuits while maintaining electrical contact for parallel testing.
3Reliability
If iterative tests are performed on the electronic device, then reliability testing is improved, but damage accumulation to the via hole inspection terminal occurs
Solution Approach 1:
The elastic body provides pre-configured cushioning that protects the via hole inspection terminal during each iterative test. By absorbing impact forces before they reach the terminal, the cushioning mechanism extends the terminal's service life while enabling repeated reliability testing.
Solution Approach 2:
The test socket acts as a protective intermediary between the testing equipment and the via hole inspection terminal during iterative tests. This intermediary absorbs mechanical stress and electrical spikes, allowing multiple test cycles without damaging the terminal, thus extending its operational duration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The test socket effectively performs reliability tests on SSDs by ensuring stable contact with test terminals, preventing damage and short circuits, and maintaining the integrity of the electronic device during testing.
Implementation Method 1
the spring elastically supports the contact pin
Implementation Method 2
an elastic body configured to provide a restoring force between the first and second bodies to bring the plurality of interface pins toward the sample mounted on the fixing portion
Data Source
AI summary
A test socket includes: a first body including a fixing portion configured to receive a sample having a plurality of test terminals; a second body facing the first body and coupled with the first body such that the second body rotates relative to the first body about a hinge pin; a test board provided on the second body and configured to test the sample, wherein the test board has a plurality of first openings provided therein; and a plurality of interface pins penetrating through the first openings, wherein each of the plurality of interface pins includes a contact pin and a spring, wherein the contact pin is provided in a first end portion of each of the plurality of interface pin and is configured to come into contact with a test terminal of the plurality of test terminals, and the spring elastically supports the contact pin.