Test Socket Multiple Insertion Testing
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Solution Overview
Problem
Existing contact resistance (CRES) test systems are limited by the number of channels, requiring replacement with a larger and costly system when testing sockets with a probe array size exceeds the available channels, limiting the testing capabilities for larger test sockets.
Innovation Solution
Implementing a method that uses a non-square interface board with a pad array to allow multiple insertions of a test socket, where a first subset of probes is tested in one orientation and a second subset in a different orientation, effectively increasing the tested probe array size without needing a new CRES test system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a CRES test system with a fixed number of channels is used, then the testing capability is limited to probe arrays that fit within the channel count, but upgrading to a larger system increases cost
Solution Approach 1:
The probe array is divided into multiple subsets that are tested sequentially through multiple insertions. The interface board is segmented into different pad regions that can be selectively engaged by rotating the test socket, allowing each insertion to test a specific subset of probes rather than requiring all probes to be tested simultaneously
Solution Approach 2:
The test socket is designed to be rotatable between insertions, changing its orientation relative to the interface board. This dynamic repositioning allows different subsets of probes to be brought into contact with the pads during different insertions, effectively multiplying the testing capacity without increasing the number of physical test channels
2Quantity of substance
If the number of probes exceeds the number of CRES test system channels, then testing cannot be performed with the current system, but replacing the system is costly
Solution Approach 1:
The testing process uses periodic insertions with the test socket, where each insertion tests a different subset of probes. By rotating the socket between insertions and performing multiple test cycles, all probes are eventually tested despite having fewer channels than total probes. This periodic retesting approach allows the system to handle larger probe arrays without hardware upgrades
Solution Approach 2:
The interface board is pre-configured with specific pad arrangements that correspond to different probe subsets based on socket orientation. Before each insertion, the system knows which subset will be tested based on the intended orientation, allowing for optimized test sequences and efficient use of available channels
Data Source
AI summary
Examples described herein provide for testing of a test socket using multiple insertions to a contact resistance (CRES) test system. In an example, the test socket is placed in a first orientation on an interface board electrically connected to a test system. Using the test system and through the interface board, a first subset of probes of the test socket is tested while the test socket is in the first orientation on the interface board. The test socket is placed in a second orientation different from the first orientation on the interface board. Using the test system and through the interface board, a second subset of probes of the test socket is tested while the test socket is in the second orientation on the interface board. At least some probes of the second subset of probes are different from the first subset of probes.