Test Socket Probe Alignment via Merged Drilling
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Solution Overview
Problem
Conventional methods of fabricating test sockets for high-frequency or high-speed semiconductor testing suffer from increased process and alignment errors as the number of probes increases, leading to deteriorated insertion loss, return loss, crosstalk, isolation, Z-Impedance, and inductance characteristics.
Innovation Solution
A method of fabricating a test socket that involves forming plate-shaped coupling blocks by integrating conductive base members with insulating members, and then forming probe accommodating holes and support holes in a single process, reducing alignment and process errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If probe accommodating holes and support holes are formed individually in separate processes, then the fabrication process is simpler and more flexible, but the alignment precision and manufacturing precision deteriorate as the number of probes increases
Solution Approach 1:
The patent merges the formation of probe accommodating holes and support holes into a single drilling process. The drill bit simultaneously creates both the barrel accommodating hole in the conductive block and the support hole in the insulating support plate, eliminating the need for separate drilling operations and ensuring precise alignment between the two hole types.
Solution Approach 2:
The patent employs preliminary action by pre-positioning the drill bit at the correct location before drilling. The drill bit is positioned to intersect both the conductive block and insulating support plate at the precise point where the probe will be inserted, ensuring that both holes are formed with accurate alignment from the start.
2Adaptability or versatility
If the number of probes is increased to improve testing capability, then the testing functionality is enhanced, but the process error and alignment error increase leading to deteriorated electrical characteristics
Solution Approach 1:
By combining multiple hole formations into a single drilling operation, the patent reduces cumulative process errors. When multiple probes are accommodated in one test socket, all corresponding barrel accommodating holes and support holes are created in one continuous drilling process, ensuring consistent alignment across all probes without the added error of multiple separate operations.
3Object-affected harmful factors
If signal probes are supported in a non-contact state on a conductive block, then interference and noise between adjacent signal probes are shielded, but the alignment between probe accommodating holes and support holes becomes more difficult to maintain
Solution Approach 1:
The patent addresses the alignment challenge of non-contact probe support by merging the hole formation processes. The single drilling operation that creates both the barrel accommodating hole in the conductive block and the support hole in the insulating support plate ensures precise alignment, which is critical for maintaining the non-contact support configuration that provides interference shielding.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method improves the accuracy of signal probe positioning along the central axis of the probe accommodating holes, thereby enhancing insertion loss, return loss, crosstalk, isolation, Z-Impedance, and inductance characteristics.
Implementation Method 1
arranging a first adhesive sheet between the first base member and the first insulating member; and heating and pressing the first adhesive sheet
Data Source
AI summary
The disclosure relates to a method of fabricating a test socket including forming a plate-shaped first coupling block by joining a first base member made of a conductive material and a first insulating member made of an insulating material; forming a plate-shaped second coupling block by joining a second base member made of the conductive material and a second insulating member made of the insulating material; forming a first barrel accommodating hole for accommodating a part of the probe and a first support hole for supporting one end portion of the probe in the first coupling block; forming a second barrel accommodating hole for accommodating the rest of the probe and a first support hole for supporting the other end portion of the probe in the second coupling block; inserting one end of the probe into the first barrel accommodating hole to be supported on the first support hole, and inserting the other end of the probe into the second barrel accommodating hole to be supported on the second support hole; and joining the first coupling block and the second coupling block.