Test Socket Probe Arcuate Surface Impedance Control
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Solution Overview
Problem
Existing integrated circuit testing apparatuses face challenges in maintaining optimal signal strength and impedance during high-frequency testing, particularly due to limitations in probe design and materials used, which affect the quality of device testing.
Innovation Solution
A test socket with a guide plate and main test structure featuring probes secured by an elastomeric material, where the probes have an arcuate surface for engaging traces and are designed to maintain contact through a combination of linear and arcuate extensions, ensuring consistent engagement and disengagement with integrated circuit leads or pads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional probes are used for high-frequency testing, then device testing can be performed, but signal strength and impedance cannot be maintained at optimal levels
Solution Approach 1:
The patent changes the physical parameters of the probe including using an arcuate (curved) surface instead of a straight probe body, optimizing the width and length of the conduction path, and selecting specific materials with appropriate electrical properties to maintain impedance and signal strength at high frequencies
Solution Approach 2:
The patent employs composite construction with an elastomeric material securing the probe tail end within the main test structure, combining different materials (metal for conduction, elastomer for securing) to achieve both electrical performance and mechanical stability
2Reliability
If probe dimensions are adjusted to maintain impedance, then signal strength improves, but manufacturing precision requirements increase
Solution Approach 1:
The patent uses an arcuate (curved) surface for the probe body instead of a straight geometry. This curvature is designed to maintain consistent engagement with the integrated circuit lead or pad while preserving impedance characteristics, reducing the sensitivity to minor dimensional variations during manufacturing
3Measurement precision
If probe engagement force is increased to ensure consistent contact, then measurement precision improves, but device complexity increases
Solution Approach 1:
The patent employs an elastomeric material to secure the tail end of the probe, providing elastic compliance that maintains consistent contact force through deformation rather than rigid mechanical constraints. This dynamic approach ensures reliable engagement without complex adjustment mechanisms
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances testing capabilities by maintaining desired impedance and signal strength, improving the interconnection between integrated circuit devices and load boards, thereby ensuring higher quality testing results.
Implementation Method 1
a tail end which is secured within the main test structure by an elastomeric material
Data Source
AI summary
A test socket comprising a guide plate with a lower surface engaged with an upper surface of a main test structure, the guide plate further including an upper surface which is parallel to the lower surface and an opening extending through the guide plate, the main test structure includes a body with one or more apertures through the upper surface and one or more probes mounted within the main test structure, the probes including a front end which extends through the apertures for engagement by a lead or terminal pad of a device to be tested, and a tail end which is secured within the main test structure by an elastomeric material.