Test Socket Segmented Pedestal for Semiconductor Package Positioning

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Miniaturization of semiconductor package terminals with narrower pitches and more contacts leads to positional displacement and improper seating during testing, causing test failures.

Innovation Solution

A test socket design featuring a central pedestal with insertion holes and a circumferential pedestal separated by a space wider than the insertion holes, along with a circumferential contact portion to stabilize the package and prevent positional errors, and pressing pieces to secure the package during testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the semiconductor package terminals are miniaturized with narrower pitches and more contacts, then the terminal density and integration are improved, but the positional accuracy and proper seating onto insertion holes deteriorate

Engineering Contradiction:
Improveterminal densityVSAvoidpositional accuracy
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The pedestal is segmented into a central pedestal and a circumferential pedestal separated by a space. This segmentation allows the central region to provide precise insertion holes for terminal positioning while the circumferential region provides additional support without interfering with the narrow-pitch terminals, thus resolving the contradiction between high terminal density and positional accuracy

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the pedestal are given different functions: the central pedestal region contains precisely positioned insertion holes for terminal guidance, while the circumferential pedestal region provides broader support. This local differentiation allows the system to accommodate both high-density terminals and maintain positioning accuracy

Inventive Principle:
Principle #3Local quality

2Ease of operation

If the bottom surface of the semiconductor package partially contacts the pedestal due to positioning failure, then the seating process continues, but the terminals are inserted into improper insertion holes causing test failure

Engineering Contradiction:
Improveseating processVSAvoidterminal positioning accuracy
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The space between the central and circumferential pedestals acts as a cushioning zone. When partial contact occurs, this space prevents catastrophic misalignment by providing a transition region that allows the package to settle into the correct position without forcing terminals into wrong holes, thus maintaining reliability while allowing ease of seating

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Manufacturing precision

If the circumferential pedestal is provided separated by space from the central pedestal, then the terminal positioning guidance is improved, but the structural complexity increases

Engineering Contradiction:
Improveterminal positioning precisionVSAvoidpedestal structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The circumferential pedestal serves multiple functions: it provides structural support, defines the space for positioning guidance, and prevents excessive movement. This multi-functionality justifies the increased structural complexity by delivering multiple benefits from a single design element

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11353497B2Test socket
Publication Date: 2022.06.07 YAMAICHI ELECTRONICS CO LTD
  • US11353497B2 patent drawing
  • US11353497B2 patent drawing
  • US11353497B2 patent drawing

AI summary

A test socket includes a pedestal. The pedestal includes a central pedestal including a central contact portion coming in contact with a central region of a bottom surface of a semiconductor package and a plurality of insertion holes formed to correspond to a plurality of solder balls projecting from the bottom surface of the semiconductor package, so as to allow the solder balls to be inserted into respective insertion holes. The pedestal further includes a circumferential pedestal separated from the central pedestal by a space having an opening width larger than a diameter of the insertion hole and including a circumferential contact portion coming in contact with a circumference of the bottom surface of the semiconductor package.