Test System Merging Core Devices via Buses
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Solution Overview
Problem
Conventional test systems require an additional wire to manually connect test modules, making the process inconvenient and inefficient.
Innovation Solution
A test system comprising multiple test core devices and buses, where selected test core devices are merged through buses to form a merged test core device for parallel testing of a device under test, eliminating the need for additional wires by using switching devices and controllers connected via buses.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual wire connection is used to connect test modules, then connection reliability is improved, but operation convenience deteriorates and setup time increases
Solution Approach 1:
The patent replaces manual mechanical wire connection with an automated electrical connection system using switching devices and bus bars. The switching devices automatically establish electrical connections between test core devices and the DUT based on test requirements, eliminating the need for manual wire plugging and unplugging while maintaining connection reliability through controlled electrical pathways.
Solution Approach 2:
The test system performs self-configuration through automatic connection establishment. The control device automatically selects and activates appropriate test core devices, and the switching devices automatically establish the required electrical connections without human intervention, enabling the system to serve itself in terms of connection management.
2Stability of the object's composition
If fixed test module configuration is used, then system stability is improved, but adaptability to different test points deteriorates
Solution Approach 1:
The patent implements dynamic reconfigurability in the test system through switching devices that can change connection topologies based on test requirements. The system transitions from a static fixed configuration to a dynamic reconfigurable architecture where test core devices can be selectively activated and connected to different test points of the DUT, maintaining system stability through controlled changes rather than physical reconfiguration.
Solution Approach 2:
The test system achieves universality by designing test core devices that can be dynamically selected and configured for different testing scenarios. The same physical hardware infrastructure serves multiple testing functions by activating different subsets of test core devices and establishing different connection patterns, allowing one system to adapt to varying test points and requirements.
3Measurement precision
If individual test core devices are used for each test point, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent merges multiple test core devices into a shared pool that can be dynamically allocated to different test points. Instead of having dedicated hardware for each test point, the system combines multiple functional test core devices that can be selectively activated and connected to various test points through switching devices, reducing overall device complexity while maintaining measurement precision through proper device selection and configuration.
Solution Approach 2:
The system employs partial action by activating only the necessary subset of test core devices required for each specific test scenario. Rather than all test core devices being active simultaneously for every measurement, the system selectively engages only those devices needed for the current test points, optimizing resource utilization and reducing effective system complexity during any given measurement operation.
Data Source
AI summary
A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.