Test System Configuration Optimization via Parameter Analysis
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Solution Overview
Problem
Current test systems face challenges in optimizing the configuration to minimize the cost of testing electronic devices, as existing configurations may not account for all relevant parameters, leading to suboptimal monetary expenses and inefficiencies in testing processes.
Innovation Solution
The proposed solution involves determining a second configuration of the test system based on received parameters, including operational and hardware-related specifications, to optimize the cost of testing, which can be achieved by automatically configuring the test system using robotics and graphical user interfaces to represent and render information about the optimized configuration and cost, thereby minimizing the overall cost of testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of test sites is increased to improve testing throughput, then productivity increases, but the cost of test increases due to additional hardware components
Solution Approach 1:
The system dynamically adjusts configuration parameters including the number of test sites, test boards, and controllers based on device characteristics and testing requirements. By optimizing these parameters rather than simply increasing test sites, the system achieves improved productivity while controlling test costs through intelligent parameter selection rather than brute-force hardware expansion.
2Adaptability or versatility
If more test boards and controllers are added to handle complex device testing, then adaptability improves, but device complexity increases
Solution Approach 1:
The test system is divided into modular components including test boards, controllers, and test sites that can be independently configured and combined. This segmentation allows the system to adapt to different device types by selecting and assembling appropriate modules, thereby improving versatility while managing complexity through standardized interfaces and modular architecture.
Solution Approach 2:
The test system employs universal test boards and controllers that can handle multiple device types and testing scenarios. By designing test instruments with multi-functional capabilities, the system achieves high adaptability without proportionally increasing the number of specialized components, thus controlling overall system complexity.
3Ease of operation
If manual configuration methods are used to determine test system settings, then ease of operation is maintained, but loss of time occurs due to manual calculation and optimization
Solution Approach 1:
The system automatically determines optimal test configurations by receiving device parameters and autonomously calculating the optimal number of test sites, test boards, and controllers. This self-service capability eliminates manual configuration time while maintaining ease of operation, as the system handles the complex optimization calculations without requiring user intervention in the computational process.
Solution Approach 2:
The system receives feedback about device characteristics and testing requirements, then uses this information to automatically adjust and optimize test system configuration. This closed-loop approach ensures that configuration decisions are based on actual device parameters, reducing unnecessary manual adjustments and accelerating the configuration process.
Data Source
AI summary
Example systems for determining a configuration of a test system execute operations that include receiving first parameters specifying at least part of an operation of a test system; receiving second parameters specifying at least part of a first configuration of the test system; determining a second configuration of the test system based, at least in part, on the first parameters and the second parameters, with the second configuration being determined to impact a cost of test of the test system; generating, by one or more processing devices, data for a graphical user interface representing information about the second configuration and the cost of test; and outputting the data for the graphical user interface for rendering on a display device.