Test System Syntax Conversion for Third-Party DUT Compatibility

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Solution Overview

Problem

Test systems face challenges in communicating with devices under test (DUTs) due to differences in command syntax between the test system and the third-party systems used by manufacturers.

Innovation Solution

A test system is configured with processing devices that receive a definitions file defining a third-party command syntax, convert these commands into the test system's command syntax, and send them to the test instrument to interact with the DUT.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the test system uses its native command syntax to communicate with the DUT, then the test instrument can effectively test the DUT, but the test system cannot directly understand third-party test programs written in different syntax

Engineering Contradiction:
Improvecompatibility with third-party communication protocolsVSAvoidsyntax conversion mechanism
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent introduces a syntax conversion mechanism that acts as an intermediary between third-party test programs and the test instrument. This converter translates third-party command syntax into the test system's native syntax, enabling compatibility without requiring the test instrument to understand multiple syntaxes directly. The conversion mechanism includes receiving third-party commands, translating them according to mapping rules, and executing the translated commands through the test instrument.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If the test system supports multiple third-party syntaxes natively, then compatibility with various protocols improves, but the device complexity and maintenance burden increase significantly

Engineering Contradiction:
Improvesupport for multiple third-party syntaxesVSAvoidmultiple syntax implementation
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The syntax conversion mechanism is designed as a universal translator that can handle multiple third-party syntaxes through a single unified interface. Rather than implementing each third-party syntax natively in the test instrument, the system uses a generic conversion layer that can be configured to translate from various syntaxes into the test system's native syntax, making the test instrument multi-functional without increasing its structural complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The conversion mechanism serves as a universal intermediary that mediates between diverse third-party syntaxes and the test system's native syntax. This single intermediary component replaces the need for multiple native syntax implementations, reducing device complexity while maintaining support for multiple protocols.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Manufacturing precision

If individual command translation is performed, then precision in command execution is maintained, but the conversion processing time increases

Engineering Contradiction:
Improvecommand execution precisionVSAvoidconversion processing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The system performs preliminary analysis of the third-party command syntax structure before execution. By pre-processing and categorizing commands based on their syntax patterns, the conversion mechanism can apply optimized translation rules, reducing the processing time for individual command translation while maintaining execution precision.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12235317B2Test system that converts command syntaxes
Publication Date: 2025.02.25 TERADYNE INC
  • US12235317B2 patent drawing
  • US12235317B2 patent drawing
  • US12235317B2 patent drawing

AI summary

An example test system includes a test instrument configured to test a device under test (DUT). The test instrument is configured to interact with the DUT using first commands having a first syntax. The test system also includes one or more processing devices configured (i) to receive a definitions file, where the definitions file includes information defining a second syntax that is used by a third party to communicate with the DUT, (ii) to receive second commands having the second syntax, (iii) to convert the second commands into the first commands having the first syntax based on the definitions file, and (iv) to send the first commands to the test instrument to enable the test instrument to interact with the DUT.