Test Unit for Semiconductor Packages Using Integrated Suction Probe Holder
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
When performing a continuity test between two semiconductor packages layered over each other, the use of a suction block and suction holes is required, leading to increased tact time and reduced test accuracy due to the extension and variation of the signal conduction path.
Innovation Solution
A test unit with first and second contact probes that contact electrodes on both sides of the packages, a suction holder with an elastic suction pad, and a base portion with a flow channel, allowing for testing in the layering direction without shifting the packages, thereby maintaining test accuracy and reducing tact time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a suction block with suction holes is provided between two semiconductor packages to perform continuity testing, then the packages can be held and tested, but the signal conduction path is extended and varied, causing increased tact time and reduced test accuracy
Solution Approach 1:
The invention extracts the suction function from a separate suction block and integrates it directly into the probe holder. The suction pad is mounted on the probe holder itself, eliminating the need for an intermediate suction block structure. This extraction of the suction function to the testing position allows direct contact between probes and electrodes without extending the signal path through additional components, thereby maintaining test accuracy while enabling efficient package handling.
Solution Approach 2:
The invention introduces a suction pad as an intermediary element that is integrated into the probe holder structure. This suction pad serves as the mediator between the probe holder and the semiconductor package, providing both holding and positioning functions simultaneously. By using this intermediary approach, the system achieves stable package holding without requiring a separate suction block that would extend the signal conduction path.
2Area of stationary object
If packages are arranged in layering direction for PoP structure, then mounting area is reduced and wirings are shortened, but testing requires suction blocks that prevent testing in the layering direction
Solution Approach 1:
The invention merges the suction holding function with the probe holder structure into a single integrated unit. The suction pad is mounted directly on the probe holder, combining two previously separate functions (holding and probing) into one component. This merging allows the testing system to operate directly on packages arranged in the layering direction without requiring additional suction blocks, thereby maintaining the compact PoP configuration while enabling efficient testing operations.
3Productivity
If a suction block is used to hold packages during testing, then multiple packages can be tested efficiently, but the signal path length varies causing reduced test accuracy
Solution Approach 1:
The invention extracts the suction function from a separate suction block and integrates it directly into the probe holder. The suction pad is mounted on the probe holder itself, eliminating the need for an intermediate suction block structure. This extraction of the suction function to the testing position allows direct contact between probes and electrodes without extending the signal path through additional components, thereby maintaining test accuracy while enabling efficient package handling.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient continuity testing of semiconductor packages in their layering direction, preventing increases in tact time and reducing test accuracy, while allowing for efficient package handling and signal conduction.
Implementation Method 1
a suction pad that is formed by use of an elastic material, sucks and holds the one of the contact targets
Implementation Method 2
a coil spring that biases the holding portion in a direction in which the holding portion separates from the first probe holder
Data Source
AI summary
A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.