Semiconductor Tester Instruction Transfer Mode Switching
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Solution Overview
Problem
Conventional semiconductor test apparatuses face inefficiencies in instruction transfer modes, requiring significant time for successive transfers and limiting batch transfers to self-tests only, which restricts the flexibility and speed of tester instruction delivery.
Innovation Solution
A semiconductor test apparatus that switches between successive and batch transfer modes based on the number of tester instructions, using a transfer mode setting unit to determine the optimal mode for efficient instruction delivery, allowing for flexible and faster transfer of instructions to the tester.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If successive transfer mode is used to transmit instructions to tester, then transfer reliability is maintained through handshake protocol, but transfer time increases significantly
Solution Approach 1:
The patent applies dynamics by making the transfer mode adjustable and adaptable based on test requirements. The system can dynamically switch between successive transfer mode (for reliability-critical operations) and batch transfer mode (for speed-critical operations), allowing the transfer mechanism to adapt its behavior to different operational contexts rather than being fixed in one mode.
Solution Approach 2:
The patent changes the parameter of transfer mode from a fixed state to a variable state. By introducing the ability to switch between successive and batch transfer modes, the system modifies the operational parameters of instruction transmission to optimize for either reliability or speed depending on the specific testing scenario, thus resolving the contradiction between these two requirements.
2Loss of time
If batch transfer mode is used to transmit instructions to tester, then transfer time is reduced by temporary storage in cache, but instruction types are limited to self-test only
Solution Approach 1:
The patent applies universality by enabling the batch transfer mode to handle multiple types of instructions beyond just self-test operations. The system is designed to transfer various instruction types (including non self-test instructions) in batch mode, making the transfer mechanism versatile and multi-functional rather than restricted to a single instruction category.
Solution Approach 2:
The patent makes the instruction type compatibility dynamic by allowing the batch transfer mode to adaptively handle different instruction types based on test requirements. Rather than being statically limited to self-test instructions, the system can dynamically determine which instruction types are suitable for batch transfer, expanding its adaptability while maintaining speed advantages.
3Adaptability or versatility
If successive transfer mode is used, then all instruction types can be transmitted with handshake confirmation, but testing speed and efficiency decrease
Solution Approach 1:
The patent applies segmentation by dividing instruction transmission into different categories that can be handled by appropriate transfer modes. Some instructions are segmented for successive transfer (maintaining compatibility and reliability), while others are segmented for batch transfer (optimizing speed). This segmentation allows the system to achieve high productivity overall by processing different instruction types through optimized pathways.
Solution Approach 2:
The patent introduces dynamic selection of transfer modes based on instruction type and test requirements. Rather than using a static successive transfer mode for all instructions, the system dynamically determines the optimal transfer mode for each instruction or group of instructions, thereby maintaining full instruction type compatibility while significantly improving testing speed and efficiency.
4Productivity
If batch transfer mode is used for self-test instructions, then transfer efficiency increases through cache storage, but application scope is restricted
Solution Approach 1:
The patent expands the application scope of batch transfer mode beyond self-test instructions to include various other instruction types. By making the batch transfer mechanism universal, the system can apply this high-efficiency transfer method to multiple testing scenarios and instruction categories, thus maintaining high productivity while eliminating the restriction on application scope.
Data Source
AI summary
A tester instruction generation unit generates a tester instruction for terminals of a plurality of devices connected to a tester based on an instruction of a user program and causes an instruction storage unit to store the tester instruction. A transfer mode setting unit sets a transfer mode to either a successive transfer mode or a batch transfer mode, based on the number of tester instructions in the instruction storage unit or an instruction of the user program. A transfer control unit transmits the tester instruction in the instruction storage unit to the tester in accordance with the set transfer mode.