Testing Device Parallel DUT Signal Distribution Circuit
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Solution Overview
Problem
Current testing devices are limited in the number of devices-under-test (DUTs) that can be tested in parallel due to hardware constraints, such as the number of test pins and measurement channels, which restricts the efficiency and cost-effectiveness of the testing process.
Innovation Solution
A testing device with a plurality of first terminals connected to DUTs, a signal interface, and a circuit that exchanges an identical signal with each DUT through its respective terminal, allowing for increased parallel testing without relying on the resources of the tester hardware, thereby enabling the testing of a greater number of DUTs simultaneously.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of test pins and measurement channels in the tester is increased to test more DUTs in parallel, then the number of DUTs that can be tested in parallel is improved, but the hardware complexity and cost of the tester increases
Solution Approach 1:
The patent introduces a testing device as an intermediary component between the tester and multiple DUTs. This testing device includes a circuit with multiple output terminals that can be connected to multiple DUTs, allowing a single tester to control and test multiple DUTs simultaneously through one interface, thereby eliminating the need for multiple test pins and measurement channels in the tester itself
Solution Approach 2:
The testing device serves multiple functions: it provides test signals to multiple DUTs through its circuit, receives response signals from all DUTs, and communicates with the tester through a single interface. This multi-functional design allows one device to replace what would otherwise require multiple separate tester components
2Productivity
If the number of test pins and measurement channels is increased to test more DUTs in parallel, then the testing efficiency is improved, but the test cost increases
Solution Approach 1:
By positioning the testing device as an intermediary, the patent enables multiple DUTs to be tested through a single tester interface, reducing the need for expensive hardware expansions in the tester while maintaining high parallel testing capability
Solution Approach 2:
The testing device contains a circuit that can generate and distribute identical test signals to multiple DUTs simultaneously. This signal replication capability allows one tester to effectively become multiple testers, achieving high parallelism without proportionally increasing tester hardware investment
3Adaptability or versatility
If the tester hardware resources are increased to support more parallel DUTs, then the parallel testing capability is improved, but the device complexity is worsened
Solution Approach 1:
The patent extracts the parallel signal distribution functionality from the tester and relocates it to a separate testing device. The tester only needs to provide a single interface to the testing device, while the complex multi-channel signal distribution is handled by the testing device's circuit, simplifying the tester hardware
Solution Approach 2:
The testing system is segmented into two independent parts: the tester and the testing device. The testing device is further segmented into a circuit portion (for signal distribution) and an interface portion (for tester communication). This segmentation allows the tester to remain simple while the testing device handles the complexity of parallel signal management
Data Source
AI summary
A testing device in accordance with various embodiments may include: a plurality of first terminals configured to be connected to a plurality of devices-under-test, wherein each first terminal of the plurality of first terminals may be configured to be connected to a respective device-under-test of the plurality of devices-under-test; a signal interface configured to be connected to a tester; and a circuit configured to exchange an identical first signal with each device-under-test of the plurality of devices-under-test through a respective first terminal of the plurality of first terminals, and to exchange at least one interface signal with the tester through the signal interface.