Testing Device Impedance Measurement for Open Fault Detection
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Solution Overview
Problem
Existing testing devices face challenges in accurately detecting open-type faults in passive elements of semiconductor modules due to limitations such as electrical responses from semiconductor devices and limited test voltage ranges, especially when passive elements are connected in parallel.
Innovation Solution
A testing device with a signal sensing unit and a signal processing unit that generates a test output signal and measures impedance based on element characteristic information, using RMS-to-DC conversion and digital signal processing to detect open-type faults in passive elements like capacitors and resistors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing methods are used to detect faults in passive elements, then the testing can be performed with simple equipment, but the detection accuracy is insufficient due to electrical responses from semiconductor devices and limited test voltage ranges
Solution Approach 1:
The testing device is divided into distinct functional modules: a signal generation unit that applies test voltages, a signal sensing unit that measures responses, and a signal processing unit that analyzes data. This segmentation allows each module to be optimized for its specific function, improving overall measurement precision while maintaining manageable complexity through modular design.
Solution Approach 2:
The patent introduces an intermediary signal processing unit that acts as a mediator between the raw sensor outputs and the fault detection logic. This unit performs impedance calculation and waveform analysis, effectively filtering out electrical responses from semiconductor devices and isolating the actual fault signals from passive elements.
2Reliability
If test voltage range is limited to protect semiconductor devices, then device safety is maintained, but the ability to detect open-type faults in passive elements is reduced
Solution Approach 1:
The patent changes the testing parameter from direct voltage application to impedance measurement through signal sensing. By using AC test signals and measuring impedance characteristics rather than applying high DC voltages, the system can detect open-type faults in passive elements while maintaining safe operating conditions for semiconductor devices.
Solution Approach 2:
The patent replaces direct electrical stress testing with indirect impedance-based detection. Instead of applying mechanical-like electrical stress to force fault manifestation, the system uses subtle signal sensing and impedance analysis to detect faults, substituting a gentler measurement approach that doesn't risk device damage.
3Reliability
If passive elements are connected in parallel to achieve desired electrical characteristics, then circuit performance is improved, but the difficulty and inaccuracy of detecting open-type faults increases
Solution Approach 1:
The signal processing unit implements feedback mechanisms by continuously monitoring impedance changes and comparing them against expected values. When an open-type fault occurs in a parallel-connected passive element, the feedback loop detects the impedance deviation and triggers fault identification, enabling reliable detection even in complex parallel configurations.
Solution Approach 2:
The patent transitions from detecting faults in the time domain to detecting them in the impedance domain. By measuring impedance characteristics rather than simple voltage or current responses, the system can distinguish open-type faults in parallel elements based on their unique impedance signatures, adding a new dimension to fault detection capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables accurate detection of open-type faults in passive elements by stabilizing waveforms and comparing measured impedances with reference values, improving fault detection accuracy and reliability.
Implementation Method 1
a signal processing unit to detect an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements
Implementation Method 2
The signal conversion unit may perform an RMS-to-DC conversion on the test output signal if a frequency of the test output signal is higher than a threshold frequency
Data Source
AI summary
A testing device includes a signal sensing unit and a signal processing unit. The signal sensing unit generates a test output signal by sensing a signal from a device under test including a plurality of passive elements that are connected in parallel. The signal processing unit detects an open-type fault of the plurality of passive elements by measuring an impedance of the device under test based on element characteristic information of the plurality of passive elements.