Testing Device Spike Protection Circuit Control
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Solution Overview
Problem
Current testing technologies for integrated chips (ICs) are prone to causing damage due to spikes during the testing process, leading to negative impacts and inconveniences.
Innovation Solution
A testing device with spike protection, comprising a switch, sensing circuit, and control circuit, which controls the power supply to stop outputting voltage and turn off the switch in response to sensing signals, preventing damage from spikes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the power supply circuit outputs supply voltage to the device under-test during testing, then the testing function is achieved, but spikes may damage the device under-test
Solution Approach 1:
The control circuit is configured to control the power supply circuit to stop outputting the supply voltage before the switch is turned off. This preliminary action of stopping voltage output before switch-off prevents spikes from damaging the device under-test while maintaining testing functionality
Solution Approach 2:
The sensing circuit monitors the state of the device under-test and provides feedback to the control circuit, which then adjusts the power supply circuit and switch accordingly. This feedback mechanism ensures the device is protected from spikes while enabling continuous testing
2Reliability
If the switch remains on during testing, then power supply is maintained to the device under-test, but spike damage may occur
Solution Approach 1:
The control circuit acts as an intermediary between the sensing circuit and the power supply circuit/switch. It processes sensing signals and coordinates the timing of voltage shutdown and switch-off, providing protected testing operation without requiring direct complex control of the switch by the user
Solution Approach 2:
The sensing circuit automatically monitors the device under-test and generates sensing signals that trigger the control circuit to protect the device. This self-service mechanism protects the device without requiring external intervention or complex user operations
Data Source
AI summary
A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.