Crystallographic Texture Mapping with Missing Euler Angle Correction

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Solution Overview

Problem

Existing measurement techniques for determining microtexture regions (MTRs) in polycrystalline materials, such as Ti-6Al-4V, are limited by inaccurate or missing third Euler angles (φ2), leading to difficulties in differentiating crystal orientations and determining MTR statistics, especially in large areas that exceed the field of view of scanning electron microscopes.

Innovation Solution

A method and system that adjusts and corrects the third Euler angle (φ2) using processing circuitry, enabling accurate determination of MTRs and MTR size statistics from data sets with missing or erroneous third Euler angles, utilizing devices like polarized light or spatially resolved acoustic spectroscopy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If alternative measurement devices (polarized light, SRAS) are used to measure large areas, then measurement area and cost-effectiveness are improved, but measurement precision of third Euler angles deteriorates due to missing or erroneous data

Engineering Contradiction:

Improvemeasurement areaVSAvoidthird Euler angle precision

Core Design Contradiction:

Area of stationary objectVSMeasurement precision

Solution Approach 1:

The system uses feedback from the known Burgers orientation relationship between alpha and beta phases to iteratively adjust and refine the third Euler angle measurements. By comparing measured alpha phase orientations with expected beta phase orientations through the Burgers relationship, the system continuously corrects measurement errors and improves precision without sacrificing measurement area coverage

Inventive Principle:

Principle #23Feedback

Solution Approach 2:

The system changes the measurement approach by measuring the alpha phase instead of directly measuring the beta phase, and then using the Burgers orientation relationship to infer beta phase information. This parameter substitution allows use of alternative devices that can measure larger areas while maintaining the necessary crystallographic information through mathematical transformation

Inventive Principle:

Principle #35Parameter changes

2Measurement precision

If EBSD is used to obtain accurate third Euler angles, then measurement precision is improved, but device complexity and measurement time increase

Engineering Contradiction:

ImproveEuler angle accuracyVSAvoidmeasurement system complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The system introduces the Burgers orientation relationship as an intermediary that connects the easily measurable alpha phase to the desired beta phase information. Instead of using complex EBSD to directly measure beta phase, the system measures the alpha phase through simpler devices and uses the Burgers relationship as a mathematical mediator to derive the equivalent beta phase Euler angles with high accuracy

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The system replaces the mechanical/physical complexity of EBSD measurement with a computational approach. By substituting the direct measurement mechanism with a calculation-based method using the Burgers orientation relationship, the system achieves equivalent or superior measurement precision while reducing device complexity and measurement time

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If measurement data with missing third Euler angles is used directly, then processing speed is improved, but measurement precision and reliability of MTR determination deteriorate

Engineering Contradiction:

Improvedata processing speedVSAvoidMTR determination reliability

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The system performs preliminary adjustment of the third Euler angles using the Burgers orientation relationship before proceeding with MTR determination. By pre-correcting the missing or erroneous angle data based on the known crystallographic relationship, the system ensures that subsequent processing uses reliable information, maintaining both processing efficiency and determination reliability

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS12625096B2Measurement and determination of crystallographic texture with respect to position

Publication Date: 2026.05.12 ROLLS ROYCE CORP

AI summary

An example method includes measuring, by at least one of a polarized light device, a spatially resolved acoustic spectroscopy device, or an eddy current device, an alpha phase data set indicative of an alpha phase of a crystalline structure of a material. The method includes receiving, by processing circuitry, the alpha phase data set, wherein the alpha phase data set comprises a plurality of pixels, wherein each pixel of the plurality of pixels includes a position, a first Euler angle, a second Euler angle, and a third Euler angle, wherein the third Euler angle is missing or erroneous. The method also includes adjusting, by the processing circuitry, the third Euler angle of a pixel of the plurality of pixels and storing, by the processing circuitry and based on adjusting the third Euler angle of the pixel reducing a total beta phase misorientation, the alpha phase data set.