Thin Film Transistor Array Substrate for High-Resolution X-Ray Detectors

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Solution Overview

Problem

Current high-resolution digital X-ray detectors face challenges in improving photo-sensitivity, reducing interference between PIN diodes, enhancing PIN diode stability, minimizing parasitic capacitance, and increasing the light-receiving area, which are crucial for achieving better performance in medical imaging applications.

Innovation Solution

A thin-film transistor array substrate design is proposed, featuring a PIN diode configuration with a third electrode inside the PIN diode, a planarization layer to reduce curvature and parasitic capacitance, and a bias line configuration that overlaps with data or gate lines but does not extend beyond them, maximizing the PIN diode area and fill factor while minimizing interference and capacitance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If the PIN diode area is increased to improve photo-sensitivity and fill factor, then the light-receiving area is maximized, but interference between adjacent PIN diodes increases

Engineering Contradiction:
ImprovePIN diode areaVSAvoidinterference between adjacent PIN diodes
Core Design Contradiction:
Area of moving objectVSObject-affected harmful factors

Solution Approach 1:

The second electrode of the thin-film transistor is disposed inside the PIN diode structure, nesting the transistor electrode within the diode's active region. This allows the PIN diode to extend closer to adjacent diodes without increasing external interference, as the internal electrode placement optimizes space utilization while maintaining electrical isolation.

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The planarization layer is applied specifically in regions where electrode overlap occurs to locally reduce parasitic capacitance, while the PIN diode area is maximized in light-receiving regions. This localized optimization allows different parts of the device to have different structural characteristics suited to their specific functions.

Inventive Principle:
Principle #3Local quality

2Reliability

If the planarization layer is added to reduce curvature and parasitic capacitance, then the stability and capacitance are improved, but the device complexity increases

Engineering Contradiction:
ImprovePIN diode stabilityVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The planarization layer serves multiple functions simultaneously: it flattens the substrate curvature to improve manufacturing uniformity, reduces parasitic capacitance between overlapping electrodes, and provides a stable base for subsequent electrode deposition. This multi-functionality justifies the added structural element by delivering multiple benefits from a single component.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Area of moving object

If the second electrode is disposed inside the PIN diode, then the fill factor is improved, but parasitic capacitance increases

Engineering Contradiction:
Improvefill factorVSAvoidparasitic capacitance
Core Design Contradiction:
Area of moving objectVSObject-generated harmful factors

Solution Approach 1:

The planarization layer is strategically applied in the regions where the second electrode overlaps with the PIN diode structure. This localized treatment reduces parasitic capacitance precisely where the internal electrode placement creates overlap, while allowing the electrode to maintain its position for optimal fill factor in other regions.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances photo-sensitivity, stability, and reduces parasitic capacitance, leading to improved performance and resolution in digital X-ray detectors by maximizing the PIN diode area and fill factor, thereby addressing the limitations of existing technologies.

Implementation Method 1

a PIN diode on the first planarization layer, the PIN diode including a third electrode connected to the thin-film transistor, a PIN layer and a fourth electrode on the PIN layer

Methodology Applied
Scientific EffectPhoto-sensitivity: Photoelectric Effect

Data Source

PatentUS11335706B2Thin film transistor array substrate for high-resolution digital X-ray detector and high-resolution digital X-ray detector including the same
Publication Date: 2022.05.17 LG DISPLAY CO LTD
  • US11335706B2 patent drawing
  • US11335706B2 patent drawing
  • US11335706B2 patent drawing

AI summary

Disclosed are a thin-film transistor array substrate for a high-resolution digital X-ray detector and a high-resolution digital X-ray detector including the same, in which a photo-sensitivity is improved by increasing a fill factor, a stability of the PIN diode is improved, and generation of parasitic capacitance is reduced or minimized. In one embodiment, the PIN diode maximally extends so that electrodes and contact holes of the thin-film transistor is disposed inside the PIN diode. A planarization layer of organic material is present between the electrodes or wirings. Further, a light receiving region of the PIN diode is increased or maximized by positioning the bias line to overlap the data line or the gate line so as not to overlap with the PIN diode.