Thin Film Transistor Channel Formation via Embossing Template

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Solution Overview

Problem

Conventional methods for forming semiconductor channel layers in thin film transistors often result in surface erosion due to direct contact with photoresist layers, affecting device performance.

Innovation Solution

A manufacturing method using an embossing template with recess portions to form semiconductor channel layers directly on the source and drain electrode layers, avoiding photolithography and subsequent photoresist layer contact, which includes pre-curing the semiconductor solution material and aligning the embossing template under vacuum conditions to create protrusions in the shape of the recess portions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If photolithography method is used to form semiconductor channel layer, then manufacturing process can be implemented, but surface of semiconductor layer is eroded due to direct contact with photoresist layer

Engineering Contradiction:
Improvemanufacturing process implementationVSAvoidsurface quality of semiconductor channel layer
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent introduces an embossing template as an intermediary tool to transfer the semiconductor channel layer pattern. The template has recess portions that define the channel layer shape, allowing the semiconductor material to be deposited only in these recess areas. This eliminates the need for photoresist layers and their associated erosion problems, while still achieving precise pattern formation through the template's physical structure.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If photolithography method is used with photoresist layer, then pattern formation is achieved, but device performance deteriorates due to eroded semiconductor surface affecting contact with dielectric insulation layer

Engineering Contradiction:
Improvepattern formation capabilityVSAvoiddevice performance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The embossing template serves as a mediator that transfers the pattern without causing surface damage. By using the template's recess portions to physically define the pattern boundaries during material deposition, the method achieves precise pattern formation while keeping the semiconductor surface intact, thereby ensuring good contact with the dielectric insulation layer and maintaining device performance.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent uses the embossing template to copy the desired semiconductor channel layer pattern onto the substrate. The recess portions of the template create a negative impression that defines the channel layer shape. This copying mechanism allows precise pattern reproduction without the harmful effects of photoresist, as the template itself directly shapes the semiconductor material through physical contact during deposition.

Inventive Principle:
Principle #26Copying

3Ease of manufacture

If conventional photolithography process is used, then semiconductor channel layer can be formed, but material costs increase due to consumption of photoresist and other chemicals

Engineering Contradiction:
Improvesemiconductor channel layer formationVSAvoidmaterial costs
Core Design Contradiction:
Ease of manufactureVSLoss of substance

Solution Approach 1:

The embossing template acts as a reusable intermediary tool that replaces consumable photoresist materials. The template can be used repeatedly to transfer the pattern, eliminating the need for continuous photoresist application and removal cycles. This significantly reduces material consumption and associated costs, while still achieving precise semiconductor channel layer formation.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent implements a process where the embossing template is recovered and reused across multiple manufacturing cycles. Instead of discarding photoresist after a single use, the durable template maintains its pattern-defining recess portions and can be used repeatedly, thereby recovering a significant material investment and reducing ongoing material costs.

Inventive Principle:
Principle #34Discarding and recovering

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method prevents surface erosion of the semiconductor channel layer, improves device performance by enhancing the contact between the semiconductor channel layer and the dielectric insulation layer, and reduces material costs by eliminating the need for photoresist and allowing for reusable embossing templates.

Implementation Method 1

the recess portions of the embossing template are aligned with the predetermined position under vacuum conditions; the embossing template is pressed onto the pre-cured semiconductor solution material under vacuum conditions

Methodology Applied
Scientific EffectVacuum: Vacuum

Implementation Method 2

The semiconductor solution material is pre-cured

Methodology Applied
Scientific EffectCuring: Heat Treatment

Implementation Method 3

The protrusions are cured and the embossing template and the baseplate are separated to form the semiconductor channel layer

Methodology Applied
Scientific EffectCuring: Heat Treatment

Data Source

PatentUS10347838B2Manufacturing method for thin film transistors and display panel
Publication Date: 2019.07.09 WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
  • US10347838B2 patent drawing
  • US10347838B2 patent drawing
  • US10347838B2 patent drawing

AI summary

The present disclosure provides a manufacturing method for thin film transistors and a display panel, in which a semiconductor channel layer is formed by embossing on a semiconductor solution material directly by using an embossing template having a semiconductor channel layer pattern, thus it does not need to form a photoresist layer on the semiconductor solution material to form a semiconductor channel layer, the erosion of the semiconductor channel layer caused by the photoresist can be avoided, thereby the product quality and the device performance are improved.